| TEST |
TEST DATA DOCUMENT |
81349-MIL-C-10950 SPECIFICATION |
| PRMT |
PRECIOUS MATERIAL (NON-CORE) |
SILVER |
| CQWM |
NONDERATED CONTINUOUS VOLTAGE RATING AND TYPE PER SECTION |
500.0 DC SINGLE SECTION |
| CWQF |
QUALITY FACTOR AT REFERENCE TEMP |
800.0000 |
| ABMK |
OVERALL WIDTH (NON-CORE) |
0.085 INCHES NOMINAL |
| ZZZK |
SPECIFICATION/STANDARD DATA |
81349-MIL-C-10950/1 GOVERNMENT SPECIFICATION |
| PMLC |
PRECIOUS MATERIAL AND LOCATION |
TERMINAL SURFACE SILVER |
| AEBZ |
SCHEMATIC DIAGRAM DESIGNATOR |
ELECTRODE(S) GROUNDED TO CASE |
| CQBF |
INSULATION RESISTANCE AT MAXIMUM OPERATING TEMP |
15000.0 MEGOHMS |
| AAQL |
BODY STYLE |
BUTTON TYPE, W/MTG TABS |
| ADAQ |
BODY LENGTH |
0.085 INCHES NOMINAL |
| ABHP |
OVERALL LENGTH (NON-CORE) |
0.762 INCHES NOMINAL |
| AARG |
RELIABILITY INDICATOR |
NOT ESTABLISHED |
| CRTP |
TOLERANCE RANGE PER SECTION |
-2.00/+2.00 PERCENT SINGLE SECTION |
| CWSG |
TERMINAL SURFACE TREATMENT |
SILVER |
| CRDN |
TEMP COEFFICIENT OF CAPACITANCE RANGE PER SECTION IN PPM PER DEG CELSIUS |
-20.0/+100.0 SINGLE SECTION |
| CWJK |
CASE MATERIAL |
METAL |
| TTQY |
TERMINAL TYPE AND QUANTITY |
1 TAB, SOLDER LUG |
| CWPK |
INSULATION RESISTANCE AT REFERENCE TEMP |
50000.0 MEGOHMS |
| CQJJ |
NONDERATED OPERATING TEMP |
-55.0 DEG CELSIUS MINIMUM AND 85.0 DEG CELSIUS MAXIMUM |
| ABPM |
BODY DIAMETER |
0.450 INCHES NOMINAL |
| ABKW |
OVERALL HEIGHT (NON-CORE) |
0.085 INCHES NOMINAL |
| CWPM |
DISSIPATION FACTOR AT REFERENCE TEMP IN PERCENT |
0.0100 |
| CQBQ |
CAPACITANCE VALUE PER SECTION |
51.000 PICOFARADS SINGLE SECTION |