| CWPK |
INSULATION RESISTANCE AT REFERENCE TEMP |
1500.0 MEGOHM-MICROFARADS |
| CRTP |
TOLERANCE RANGE PER SECTION |
-15.00/+15.00 PERCENT SINGLE SECTION |
| AAQL |
BODY STYLE |
W/THD MTG HOLE(S)/STUD(S) TERMINAL(S) ON ONE SURFACE |
| CQBQ |
CAPACITANCE VALUE PER SECTION |
7.000 MICROFARADS SINGLE SECTION |
| ADAT |
BODY WIDTH |
1.500 INCHES NOMINAL |
| ABKW |
OVERALL HEIGHT (NON-CORE) |
5.625 INCHES NOMINAL |
| AEHA |
DISTANCE BETWEEN CENTERLINES OF MOUNTING FACILITIES PARALLEL TO BODY WIDTH |
0.719 INCHES NOMINAL |
| ABHP |
OVERALL LENGTH (NON-CORE) |
2.406 INCHES NOMINAL |
| TEST |
TEST DATA DOCUMENT |
81349-MIL-C-25 SPECIFICATION |
| TTQY |
TERMINAL TYPE AND QUANTITY |
2 THREADED STUD |
| CQWM |
NONDERATED CONTINUOUS VOLTAGE RATING AND TYPE PER SECTION |
400.0 DC SINGLE SECTION |
| ADAU |
BODY HEIGHT |
4.750 INCHES NOMINAL |
| AXHR |
MOUNTING FACILITY TYPE AND QUANTITY |
4 THREADED MOUNTING STUDS |
| ADAQ |
BODY LENGTH |
2.406 INCHES NOMINAL |
| AEBY |
DISTANCE BETWEEN CENTERLINES OF MOUNTING FACILITIES PARALLEL TO BODY LENGTH |
1.781 INCHES NOMINAL |
| AEBQ |
CENTER TO CENTER DISTANCE BETWEEN TERMINALS PARALLEL TO WIDTH |
0.703 INCHES NOMINAL |
| AARG |
RELIABILITY INDICATOR |
NOT ESTABLISHED |
| CWJK |
CASE MATERIAL |
METAL |
| AEBU |
TERMINAL HEIGHT FROM BODY |
0.875 INCHES NOMINAL |
| AEBZ |
SCHEMATIC DIAGRAM DESIGNATOR |
NO COMMON OR GROUNDED ELECTRODE(S) |
| CQJJ |
NONDERATED OPERATING TEMP |
-55.0 DEG CELSIUS MINIMUM AND 85.0 DEG CELSIUS MAXIMUM |
| CBBL |
FEATURES PROVIDED |
HERMETICALLY SEALED CASE |
| CWPM |
DISSIPATION FACTOR AT REFERENCE TEMP IN PERCENT |
1.0000 |
| ABMK |
OVERALL WIDTH (NON-CORE) |
1.500 INCHES NOMINAL |
| CQBF |
INSULATION RESISTANCE AT MAXIMUM OPERATING TEMP |
15.0 MEGOHM-MICROFARADS |
| CWSG |
TERMINAL SURFACE TREATMENT |
SOLDER |