| AAQL |
BODY STYLE |
W/O MTG FACILITIES, TERMINAL(S) ON ONE SURFACE |
| CQWM |
NONDERATED CONTINUOUS VOLTAGE RATING AND TYPE PER SECTION |
600.0 DC SINGLE SECTION |
| TTQY |
TERMINAL TYPE AND QUANTITY |
2 SOLDER STUD |
| ADAT |
BODY WIDTH |
1.250 INCHES NOMINAL |
| AARG |
RELIABILITY INDICATOR |
NOT ESTABLISHED |
| ADAQ |
BODY LENGTH |
3.750 INCHES NOMINAL |
| TEST |
TEST DATA DOCUMENT |
81350-JAN-C-25 SPECIFICATION |
| AEBU |
TERMINAL HEIGHT FROM BODY |
1.375 INCHES NOMINAL |
| CWJK |
CASE MATERIAL |
METAL |
| AEBP |
CENTER TO CENTER DISTANCE BETWEEN TERMINALS PARALLEL TO LENGTH |
2.000 INCHES NOMINAL |
| AEBZ |
SCHEMATIC DIAGRAM DESIGNATOR |
NO COMMON OR GROUNDED ELECTRODE(S) |
| CQJJ |
NONDERATED OPERATING TEMP |
-55.0 DEG CELSIUS MINIMUM AND 85.0 DEG CELSIUS MAXIMUM |
| CBBL |
FEATURES PROVIDED |
HERMETICALLY SEALED CASE |
| CQBQ |
CAPACITANCE VALUE PER SECTION |
8.000 MICROFARADS SINGLE SECTION |
| CRTP |
TOLERANCE RANGE PER SECTION |
-10.00/+20.00 PERCENT SINGLE SECTION |
| ADAU |
BODY HEIGHT |
4.250 INCHES NOMINAL |
| CQBF |
INSULATION RESISTANCE AT MAXIMUM OPERATING TEMP |
20.0 MEGOHM-MICROFARADS |
| CWPK |
INSULATION RESISTANCE AT REFERENCE TEMP |
2000.0 MEGOHM-MICROFARADS |
| CWPM |
DISSIPATION FACTOR AT REFERENCE TEMP IN PERCENT |
1.0000 |
| CWSG |
TERMINAL SURFACE TREATMENT |
SOLDER |