| CWPK |
INSULATION RESISTANCE AT REFERENCE TEMP |
1500.0 MEGOHM-MICROFARADS |
| AAQL |
BODY STYLE |
W/O MTG FACILITIES, TERMINAL(S) ON ONE SURFACE |
| ZZZK |
SPECIFICATION/STANDARD DATA |
81349-MIL-C-25/7E GOVERNMENT SPECIFICATION |
| TEST |
TEST DATA DOCUMENT |
81349-MIL-C-25 SPECIFICATION |
| CQWM |
NONDERATED CONTINUOUS VOLTAGE RATING AND TYPE PER SECTION |
1000.0 DC SINGLE SECTION |
| ABJT |
TERMINAL LENGTH |
1.375 INCHES MAXIMUM |
| TTQY |
TERMINAL TYPE AND QUANTITY |
2 TAB, SOLDER LUG |
| CQBQ |
CAPACITANCE VALUE PER SECTION |
10.000 MICROFARADS SINGLE SECTION |
| ADAU |
BODY HEIGHT |
4.750 INCHES NOMINAL |
| CRTP |
TOLERANCE RANGE PER SECTION |
-10.00/+10.00 PERCENT SINGLE SECTION |
| AARG |
RELIABILITY INDICATOR |
NOT ESTABLISHED |
| ADAQ |
BODY LENGTH |
3.750 INCHES NOMINAL |
| CWJK |
CASE MATERIAL |
METAL |
| AEBP |
CENTER TO CENTER DISTANCE BETWEEN TERMINALS PARALLEL TO LENGTH |
2.000 INCHES NOMINAL |
| ABKW |
OVERALL HEIGHT (NON-CORE) |
6.125 INCHES NOMINAL |
| AFHW |
INTERNAL ELECTRICAL CONNECTION TYPE |
INSERTED TAB |
| ABHP |
OVERALL LENGTH (NON-CORE) |
3.750 INCHES NOMINAL |
| AEBZ |
SCHEMATIC DIAGRAM DESIGNATOR |
NO COMMON OR GROUNDED ELECTRODE(S) |
| CQJJ |
NONDERATED OPERATING TEMP |
-55.0 DEG CELSIUS MINIMUM AND 85.0 DEG CELSIUS MAXIMUM |
| CBBL |
FEATURES PROVIDED |
HERMETICALLY SEALED CASE |
| CWPM |
DISSIPATION FACTOR AT REFERENCE TEMP IN PERCENT |
1.0000 |
| ADAT |
BODY WIDTH |
1.750 INCHES NOMINAL |
| CQBF |
INSULATION RESISTANCE AT MAXIMUM OPERATING TEMP |
15.0 MEGOHM-MICROFARADS |
| ABMK |
OVERALL WIDTH (NON-CORE) |
1.750 INCHES NOMINAL |
| CWSG |
TERMINAL SURFACE TREATMENT |
SOLDER |