| CRHD |
TOLERANCE OF TEMP COEFFICIENT PER SECTION IN PPM PER DEG CELSIUS |
-30.0/+30.0 SINGLE SECTION |
| CQLZ |
TEMP COEFFICIENT OF CAPACITANCE PER SECTION IN PPM PER DEG CELSIUS |
-750.0 SINGLE SECTION |
| CQBQ |
CAPACITANCE VALUE PER SECTION |
47.000 PICOFARADS SINGLE SECTION |
| ADAU |
BODY HEIGHT |
0.100 INCHES NOMINAL |
| CQWM |
NONDERATED CONTINUOUS VOLTAGE RATING AND TYPE PER SECTION |
150.0 DC SINGLE SECTION |
| AARG |
RELIABILITY INDICATOR |
NOT ESTABLISHED |
| CRTP |
TOLERANCE RANGE PER SECTION |
-2.00/+2.00 PERCENT SINGLE SECTION |
| CQBF |
INSULATION RESISTANCE AT MAXIMUM OPERATING TEMP |
1000.0 MEGOHMS |
| AAQL |
BODY STYLE |
W/O MTG FACILITIES TERMINAL(S) ON ONE SURFACE |
| ADAT |
BODY WIDTH |
0.200 INCHES NOMINAL |
| CWJK |
CASE MATERIAL |
CERAMIC |
| ADAQ |
BODY LENGTH |
0.200 INCHES NOMINAL |
| ABHP |
OVERALL LENGTH (NON-CORE) |
0.200 INCHES NOMINAL |
| TEST |
TEST DATA DOCUMENT |
81349-MIL-C-20 SPECIFICATION |
| AEBP |
CENTER TO CENTER DISTANCE BETWEEN TERMINALS PARALLEL TO LENGTH |
0.085 INCHES MINIMUM AND 0.115 INCHES MAXIMUM |
| AEBZ |
SCHEMATIC DIAGRAM DESIGNATOR |
NO COMMON OR GROUNDED ELECTRODE(S) |
| CWPK |
INSULATION RESISTANCE AT REFERENCE TEMP |
50000.0 MEGOHMS |
| CQJJ |
NONDERATED OPERATING TEMP |
-55.0 DEG CELSIUS MINIMUM AND 150.0 DEG CELSIUS MAXIMUM |
| ABKW |
OVERALL HEIGHT (NON-CORE) |
0.100 INCHES NOMINAL |
| ABJT |
TERMINAL LENGTH |
1.250 INCHES MINIMUM |
| ABMK |
OVERALL WIDTH (NON-CORE) |
0.200 INCHES NOMINAL |
| TTQY |
TERMINAL TYPE AND QUANTITY |
2 UNINSULATED WIRE LEAD |
| CWQF |
QUALITY FACTOR AT REFERENCE TEMP |
1000.0000 |
| CWSG |
TERMINAL SURFACE TREATMENT |
SOLDER |