| CQJJ |
NONDERATED OPERATING TEMP |
55.0 DEG CELSIUS MINIMUM AND 125.0 DEG CELSIUS MAXIMUM |
| CQWM |
NONDERATED CONTINUOUS VOLTAGE RATING AND TYPE PER SECTION |
50.0 DC SINGLE SECTION |
| ABJT |
TERMINAL LENGTH |
0.025 INCHES MINIMUM |
| ADAQ |
BODY LENGTH |
0.100 INCHES NOMINAL |
| FEAT |
SPECIAL FEATURES |
SELECTED ITEM; TYPE DESIGNATION: CDR01BP101BKSM |
| AARG |
RELIABILITY INDICATOR |
ESTABLISHED |
| CQBQ |
CAPACITANCE VALUE PER SECTION |
100.000 PICOFARADS SINGLE SECTION |
| TTQY |
TERMINAL TYPE AND QUANTITY |
2 BONDING PAD |
| CRTP |
TOLERANCE RANGE PER SECTION |
-10.00/+10.00 PERCENT SINGLE SECTION |
| CWPM |
DISSIPATION FACTOR AT REFERENCE TEMP IN PERCENT |
2.5000 |
| TEST |
TEST DATA DOCUMENT |
81349-MIL-C-55681B/1A SPECIFICATION AND 98230-0N225132 DRAWING |
| AAQL |
BODY STYLE |
CHIP TYPE |
| CQBF |
INSULATION RESISTANCE AT MAXIMUM OPERATING TEMP |
1000.0 MEGOHMS |
| AEBP |
CENTER TO CENTER DISTANCE BETWEEN TERMINALS PARALLEL TO LENGTH |
0.050 INCHES NOMINAL |
| CWJK |
CASE MATERIAL |
CERAMIC |
| CQFB |
VOLTAGE TEMP LIMITS PER SECTION IN PERCENT CAPACITANCE CHANGE |
-30.0/+30.0 WITH RATED VOLTAGE APPLIED SINGLE SECTION |
| CWPK |
INSULATION RESISTANCE AT REFERENCE TEMP |
100000.0 MEGOHMS |
| AEBZ |
SCHEMATIC DIAGRAM DESIGNATOR |
NO COMMON OR GROUNDED ELECTRODE(S) |
| ZZZK |
SPECIFICATION/STANDARD DATA |
81349-MIL-C-55681D/1A GOVERNMENT SPECIFICATION |
| AGAV |
END ITEM IDENTIFICATION |
KG-46/TSEC |
| AARH |
RELIABILITY FAILURE RATE LEVEL IN PERCENT |
1.000 |
| ADAU |
BODY HEIGHT |
0.055 INCHES NOMINAL |
| ADAT |
BODY WIDTH |
0.060 INCHES MAXIMUM |