| CRHD |
TOLERANCE OF TEMP COEFFICIENT PER SECTION IN PPM PER DEG CELSIUS |
-30.0/+30.0 SINGLE SECTION |
| CQJJ |
NONDERATED OPERATING TEMP |
-55.0 DEG CELSIUS MINIMUM AND 125.0 DEG CELSIUS MAXIMUM |
| ABHP |
OVERALL LENGTH (NON-CORE) |
0.500 INCHES NOMINAL |
| ADAQ |
BODY LENGTH |
0.500 INCHES NOMINAL |
| AEBT |
TERMINAL DIAMETER |
0.015 INCHES MINIMUM AND 0.027 INCHES MAXIMUM |
| CWPM |
DISSIPATION FACTOR AT REFERENCE TEMP IN PERCENT |
0.1500 |
| AARG |
RELIABILITY INDICATOR |
ESTABLISHED |
| ABPM |
BODY DIAMETER |
0.250 INCHES NOMINAL |
| CRTP |
TOLERANCE RANGE PER SECTION |
-2.00/+2.00 PERCENT SINGLE SECTION |
| AARH |
RELIABILITY FAILURE RATE LEVEL IN PERCENT |
0.0100 |
| ABKW |
OVERALL HEIGHT (NON-CORE) |
0.250 INCHES NOMINAL |
| ZZZK |
SPECIFICATION/STANDARD DATA |
81349-MIL-C-20/30 GOVERNMENT SPECIFICATION |
| TEST |
TEST DATA DOCUMENT |
81349-MIL-C-20 SPECIFICATION |
| ABMK |
OVERALL WIDTH (NON-CORE) |
0.250 INCHES NOMINAL |
| CWPK |
INSULATION RESISTANCE AT REFERENCE TEMP |
100000.0 MEGOHMS |
| CQBQ |
CAPACITANCE VALUE PER SECTION |
0.012 MICROFARADS SINGLE SECTION |
| AEBZ |
SCHEMATIC DIAGRAM DESIGNATOR |
NO COMMON OR GROUNDED ELECTRODE(S) |
| CQBF |
INSULATION RESISTANCE AT MAXIMUM OPERATING TEMP |
10000.0 MEGOHMS |
| CQLZ |
TEMP COEFFICIENT OF CAPACITANCE PER SECTION IN PPM PER DEG CELSIUS |
0.0 SINGLE SECTION |
| ABJT |
TERMINAL LENGTH |
1.250 INCHES MINIMUM |
| TTQY |
TERMINAL TYPE AND QUANTITY |
2 UNINSULATED WIRE LEAD |
| AAQL |
BODY STYLE |
W/O MTG FACILITIES, AXIAL TERMINALS |
| CWJK |
CASE MATERIAL |
PLASTIC |
| CQWM |
NONDERATED CONTINUOUS VOLTAGE RATING AND TYPE PER SECTION |
100.0 DC SINGLE SECTION |
| CWSG |
TERMINAL SURFACE TREATMENT |
SOLDER |