| PRMT |
PRECIOUS MATERIAL (NON-CORE) |
GOLD |
| CQWM |
NONDERATED CONTINUOUS VOLTAGE RATING AND TYPE PER SECTION |
50.0 DC SINGLE SECTION |
| PMLC |
PRECIOUS MATERIAL AND LOCATION |
TERMINAL SURFACES GOLD |
| CQJJ |
NONDERATED OPERATING TEMP |
-55.0 DEG CELSIUS MINIMUM AND 125.0 DEG CELSIUS MAXIMUM |
| ABMK |
OVERALL WIDTH (NON-CORE) |
0.125 INCHES NOMINAL |
| ADAQ |
BODY LENGTH |
0.800 INCHES NOMINAL |
| CWSG |
TERMINAL SURFACE TREATMENT |
GOLD |
| AEBP |
CENTER TO CENTER DISTANCE BETWEEN TERMINALS PARALLEL TO LENGTH |
0.040 INCHES NOMINAL |
| TTQY |
TERMINAL TYPE AND QUANTITY |
2 BONDING PAD |
| CRTP |
TOLERANCE RANGE PER SECTION |
-10.00/+10.00 PERCENT SINGLE SECTION |
| AARG |
RELIABILITY INDICATOR |
NOT ESTABLISHED |
| CWPM |
DISSIPATION FACTOR AT REFERENCE TEMP IN PERCENT |
2.5000 |
| AAQL |
BODY STYLE |
CHIP TYPE |
| ABJT |
TERMINAL LENGTH |
0.020 INCHES NOMINAL |
| ABKW |
OVERALL HEIGHT |
0.025 INCHES MINIMUM AND 0.055 INCHES MAXIMUM |
| CWPK |
INSULATION RESISTANCE AT REFERENCE TEMP |
100000.0 MEGOHMS |
| AEBZ |
SCHEMATIC DIAGRAM DESIGNATOR |
NO COMMON OR GROUNDED ELECTRODE(S) |
| CWJK |
CASE MATERIAL |
CERAMIC OR GLASS |
| CQBF |
INSULATION RESISTANCE AT MAXIMUM OPERATING TEMP |
10000.0 MEGOHMS |
| ABHP |
OVERALL LENGTH (NON-CORE) |
0.800 INCHES NOMINAL |
| ADAT |
BODY WIDTH |
0.125 INCHES NOMINAL |
| CQBQ |
CAPACITANCE VALUE PER SECTION |
0.100 MICROFARADS SINGLE SECTION |
| ADAU |
BODY HEIGHT |
0.025 INCHES MINIMUM AND 0.055 INCHES MAXIMUM |
| CQFB |
VOLTAGE TEMP LIMITS PER SECTION IN PERCENT CAPACITANCE CHANGE |
-15.0/+15.0 WITHOUT VOLTAGE APPLIED SINGLE SECTION |