| CQBF |
INSULATION RESISTANCE AT MAXIMUM OPERATING TEMP |
5000.0 MEGOHMS |
| ADAT |
BODY WIDTH |
0.880 INCHES MAXIMUM |
| AEBT |
TERMINAL DIAMETER |
0.040 INCHES NOMINAL |
| CQWM |
NONDERATED CONTINUOUS VOLTAGE RATING AND TYPE PER SECTION |
500.0 DC SINGLE SECTION |
| ABMK |
OVERALL WIDTH (NON-CORE) |
1.021 INCHES MAXIMUM |
| CQBQ |
CAPACITANCE VALUE PER SECTION |
9100.000 PICOFARADS SINGLE SECTION |
| ABKW |
OVERALL HEIGHT |
0.150 INCHES MINIMUM AND 0.330 INCHES MAXIMUM |
| ABHP |
OVERALL LENGTH |
0.690 INCHES MINIMUM AND 0.790 INCHES MAXIMUM |
| CRDN |
TEMP COEFFICIENT OF CAPACITANCE RANGE PER SECTION IN PPM PER DEG CELSIUS |
+0.0/+70.0 SINGLE SECTION |
| AARG |
RELIABILITY INDICATOR |
ESTABLISHED |
| ADAU |
BODY HEIGHT |
0.150 INCHES MINIMUM AND 0.330 INCHES MAXIMUM |
| ADAQ |
BODY LENGTH |
0.690 INCHES MINIMUM AND 0.790 INCHES MAXIMUM |
| AARH |
RELIABILITY FAILURE RATE LEVEL IN PERCENT |
0.0100 |
| ABJT |
TERMINAL LENGTH |
1.000 INCHES MINIMUM |
| AAQL |
BODY STYLE |
W/O MTG FACILITIES TERMINAL(S) ON ONE SURFACE |
| CWPK |
INSULATION RESISTANCE AT REFERENCE TEMP |
100000.0 MEGOHMS |
| AEBZ |
SCHEMATIC DIAGRAM DESIGNATOR |
NO COMMON OR GROUNDED ELECTRODE(S) |
| TEST |
TEST DATA DOCUMENT |
81349-MIL-C-39001 SPECIFICATION |
| ZZZK |
SPECIFICATION/STANDARD DATA |
81349-MIL-C-39001/5 GOVERNMENT SPECIFICATION |
| CQJJ |
NONDERATED OPERATING TEMP |
-55.0 DEG CELSIUS MINIMUM AND 150.0 DEG CELSIUS MAXIMUM |
| TTQY |
TERMINAL TYPE AND QUANTITY |
2 UNINSULATED WIRE LEAD |
| CRTP |
TOLERANCE RANGE PER SECTION |
-1.00/+1.00 PERCENT SINGLE SECTION |
| AEBP |
CENTER TO CENTER DISTANCE BETWEEN TERMINALS PARALLEL TO LENGTH |
0.425 INCHES NOMINAL |
| CWJK |
CASE MATERIAL |
PLASTIC |
| CWPM |
DISSIPATION FACTOR AT REFERENCE TEMP IN PERCENT |
0.0012 |
| CWSG |
TERMINAL SURFACE TREATMENT |
SOLDER |