| CQJJ |
NONDERATED OPERATING TEMP |
-55.0 DEG CELSIUS MINIMUM AND 125.0 DEG CELSIUS MAXIMUM |
| TTQY |
TERMINAL TYPE AND QUANTITY |
1 BONDING PAD |
| PMLC |
PRECIOUS MATERIAL AND LOCATION |
TERMINATION SURFACE SILVER |
| CQWM |
NONDERATED CONTINUOUS VOLTAGE RATING AND TYPE PER SECTION |
500.0 DC SINGLE SECTION |
| CQBQ |
CAPACITANCE VALUE PER SECTION |
100.000 PICOFARADS SINGLE SECTION |
| CRTP |
TOLERANCE RANGE PER SECTION |
-10.00/+10.00 PERCENT SINGLE SECTION |
| AARG |
RELIABILITY INDICATOR |
NOT ESTABLISHED |
| AAQL |
BODY STYLE |
CHIP TYPE |
| ADAT |
BODY WIDTH |
0.110 INCHES NOMINAL |
| CWSG |
TERMINAL SURFACE TREATMENT |
SILVER |
| CWJK |
CASE MATERIAL |
CERAMIC |
| CRHD |
TOLERANCE OF TEMP COEFFICIENT PER SECTION IN PPM PER DEG CELSIUS |
-20.0/+20.0 SINGLE SECTION |
| AEBZ |
SCHEMATIC DIAGRAM DESIGNATOR |
NO COMMON OR GROUNDED ELECTRODE(S) |
| CBBL |
FEATURES PROVIDED |
HERMETICALLY SEALED CASE |
| ADAU |
BODY HEIGHT |
0.100 INCHES MAXIMUM |
| ADAQ |
BODY LENGTH |
0.140 INCHES MAXIMUM |
| CWPK |
INSULATION RESISTANCE AT REFERENCE TEMP |
1000000.0 MEGOHMS |
| CQLZ |
TEMP COEFFICIENT OF CAPACITANCE PER SECTION IN PPM PER DEG CELSIUS |
90.0 SINGLE SECTION |
| CQBF |
INSULATION RESISTANCE AT MAXIMUM OPERATING TEMP |
100000.0 MEGOHMS |
| CWQF |
QUALITY FACTOR AT REFERENCE TEMP |
10000.000 |