| CWPM |
DISSIPATION FACTOR AT REFERENCE TEMP IN PERCENT |
6.000 |
| CWQH |
DC LEAKAGE AT REFERENCE TEMP |
1.000 MICROAMPERES |
| CQJJ |
NONDERATED OPERATING TEMP |
-55.0 DEG CELSIUS MINIMUM AND 125.0 DEG CELSIUS MAXIMUM |
| AECN |
IMPEDANCE AT MINIMUM OPERATING TEMP IN OHMS |
2.0 |
| TTQY |
TERMINAL TYPE AND QUANTITY |
2 BONDING PAD |
| AECE |
ANODE TYPE |
SOLID |
| CRTP |
TOLERANCE RANGE PER SECTION |
-10.00/+10.00 PERCENT SINGLE SECTION |
| AARG |
RELIABILITY INDICATOR |
NOT ESTABLISHED |
| ADAT |
BODY WIDTH |
0.100 INCHES MAXIMUM |
| AAQL |
BODY STYLE |
CHIP TYPE |
| ABKW |
OVERALL HEIGHT (NON-CORE) |
0.080 INCHES MAXIMUM |
| ADAQ |
BODY LENGTH |
0.230 INCHES NOMINAL |
| CWJK |
CASE MATERIAL |
CERAMIC |
| CQBQ |
CAPACITANCE VALUE PER SECTION |
1.500 MICROFARADS SINGLE SECTION |
| ABHP |
OVERALL LENGTH (NON-CORE) |
0.230 INCHES NOMINAL |
| AEBZ |
SCHEMATIC DIAGRAM DESIGNATOR |
NO COMMON OR GROUNDED ELECTRODE(S) |
| ABJT |
TERMINAL LENGTH |
0.035 INCHES MINIMUM AND 0.065 INCHES MAXIMUM |
| CQLH |
DC LEAKAGE AT MAXIMUM OPERATING TEMP |
12.0 MICROAMPERES |
| CQWM |
NONDERATED CONTINUOUS VOLTAGE RATING AND TYPE PER SECTION |
35.0 DC SINGLE SECTION |
| AECQ |
ELECTRICAL POLARIZATION |
POLARIZED |
| CWNJ |
CAPACITIVE ELECTRODE MATERIAL |
TANTALUM |
| ADAU |
BODY HEIGHT |
0.080 INCHES MAXIMUM |
| ABMK |
OVERALL WIDTH (NON-CORE) |
0.100 INCHES MAXIMUM |
| CWSG |
TERMINAL SURFACE TREATMENT |
SOLDER |