| CQJJ |
NONDERATED OPERATING TEMP |
-55.0 DEG CELSIUS MINIMUM AND 125.0 DEG CELSIUS MAXIMUM |
| AARG |
RELIABILITY INDICATOR |
ESTABLISHED |
| CWSG |
TERMINAL SURFACE TREATMENT |
PALLADIUM AND SILVER |
| TTQY |
TERMINAL TYPE AND QUANTITY |
2 BONDING PAD |
| CRTP |
TOLERANCE RANGE PER SECTION |
-10.00/+10.00 PERCENT SINGLE SECTION |
| ADAQ |
BODY LENGTH |
0.110 INCHES NOMINAL |
| AARH |
RELIABILITY FAILURE RATE LEVEL IN PERCENT |
0.010 |
| ZZZK |
SPECIFICATION/STANDARD DATA |
81349-MIL-C-55681/4B GOVERNMENT SPECIFICATION |
| AAQL |
BODY STYLE |
CHIP TYPE |
| ADAT |
BODY WIDTH |
0.110 INCHES NOMINAL |
| PMLC |
PRECIOUS MATERIAL AND LOCATION |
TERMINAL FINISH SILVER |
| ADAU |
BODY HEIGHT |
0.030 INCHES MINIMUM AND 0.102 INCHES MAXIMUM |
| CQBQ |
CAPACITANCE VALUE PER SECTION |
0.150 NANOFARADS SINGLE SECTION |
| TEST |
TEST DATA DOCUMENT |
81349-MIL-C-55681C SPECIFICATION |
| AEBZ |
SCHEMATIC DIAGRAM DESIGNATOR |
NO COMMON OR GROUNDED ELECTRODE(S) |
| CQLZ |
TEMP COEFFICIENT OF CAPACITANCE PER SECTION IN PPM PER DEG CELSIUS |
0.0 SINGLE SECTION |
| CQWM |
NONDERATED CONTINUOUS VOLTAGE RATING AND TYPE PER SECTION |
300.0 DC SINGLE SECTION |