| CWPM |
DISSIPATION FACTOR AT REFERENCE TEMP IN PERCENT |
0.100 |
| CRHD |
TOLERANCE OF TEMP COEFFICIENT PER SECTION IN PPM PER DEG CELSIUS |
-30.0/+30.0 SINGLE SECTION |
| CQWM |
NONDERATED CONTINUOUS VOLTAGE RATING AND TYPE PER SECTION |
50.0 DC SINGLE SECTION |
| ADAQ |
BODY LENGTH |
0.071 INCHES MINIMUM AND 0.087 INCHES MAXIMUM |
| CQJJ |
NONDERATED OPERATING TEMP |
-55.0 DEG CELSIUS MINIMUM AND 125.0 DEG CELSIUS MAXIMUM |
| ABJT |
TERMINAL LENGTH |
0.010 INCHES MINIMUM AND 0.280 INCHES MAXIMUM |
| ABKW |
OVERALL HEIGHT (NON-CORE) |
0.050 INCHES NOMINAL |
| CQBQ |
CAPACITANCE VALUE PER SECTION |
4.000 PICOFARADS SINGLE SECTION |
| TTQY |
TERMINAL TYPE AND QUANTITY |
2 BONDING PAD |
| AARG |
RELIABILITY INDICATOR |
NOT ESTABLISHED |
| CRTP |
TOLERANCE RANGE PER SECTION |
-0.25/+0.25 PICOFARADS SINGLE SECTION |
| AAQL |
BODY STYLE |
CHIP TYPE |
| CWJK |
CASE MATERIAL |
CERAMIC |
| ADAT |
BODY WIDTH |
0.041 INCHES MINIMUM AND 0.057 INCHES MAXIMUM |
| ABHP |
OVERALL LENGTH |
0.071 INCHES MINIMUM AND 0.087 INCHES MAXIMUM |
| CWPK |
INSULATION RESISTANCE AT REFERENCE TEMP |
100000.0 MEGOHMS |
| AEBZ |
SCHEMATIC DIAGRAM DESIGNATOR |
NO COMMON OR GROUNDED ELECTRODE(S) |
| CQBF |
INSULATION RESISTANCE AT MAXIMUM OPERATING TEMP |
10000.0 MEGOHMS |
| CQLZ |
TEMP COEFFICIENT OF CAPACITANCE PER SECTION IN PPM PER DEG CELSIUS |
0.0 SINGLE SECTION |
| ADAU |
BODY HEIGHT |
0.050 INCHES NOMINAL |
| ABMK |
OVERALL WIDTH |
0.041 INCHES MINIMUM AND 0.057 INCHES MAXIMUM |
| AGAV |
END ITEM IDENTIFICATION |
6625-01-271-4942 TEST SET,RADIO |
| CWSG |
TERMINAL SURFACE TREATMENT |
SOLDER |