| CRHD |
TOLERANCE OF TEMP COEFFICIENT PER SECTION IN PPM PER DEG CELSIUS |
-30.0/+30.0 SINGLE SECTION |
| AEBP |
CENTER TO CENTER DISTANCE BETWEEN TERMINALS PARALLEL TO LENGTH |
0.185 INCHES MINIMUM AND 0.215 INCHES MAXIMUM |
| CQWM |
NONDERATED CONTINUOUS VOLTAGE RATING AND TYPE PER SECTION |
50.0 DC SINGLE SECTION |
| ADAU |
BODY HEIGHT |
0.080 INCHES MINIMUM AND 0.100 INCHES MAXIMUM |
| CQJJ |
NONDERATED OPERATING TEMP |
-55.0 DEG CELSIUS MINIMUM AND 125.0 DEG CELSIUS MAXIMUM |
| AARH |
RELIABILITY FAILURE RATE LEVEL IN PERCENT |
0.001 |
| CWPM |
DISSIPATION FACTOR AT REFERENCE TEMP IN PERCENT |
0.150 |
| AARG |
RELIABILITY INDICATOR |
ESTABLISHED |
| ABHP |
OVERALL LENGTH |
0.180 INCHES MINIMUM AND 0.300 INCHES MAXIMUM |
| CRTP |
TOLERANCE RANGE PER SECTION |
-2.00/+2.00 PERCENT SINGLE SECTION |
| ABMK |
OVERALL WIDTH |
0.280 INCHES MINIMUM AND 0.300 INCHES MAXIMUM |
| CQBQ |
CAPACITANCE VALUE PER SECTION |
5100.000 PICOFARADS SINGLE SECTION |
| ADAQ |
BODY LENGTH |
0.280 INCHES MINIMUM AND 0.300 INCHES MAXIMUM |
| AAQL |
BODY STYLE |
W/O MTG FACILITIES TERMINAL(S) ON ONE SURFACE |
| TEST |
TEST DATA DOCUMENT |
81349-MIL-C-20 SPECIFICATION |
| CWPK |
INSULATION RESISTANCE AT REFERENCE TEMP |
100000.0 MEGOHMS |
| AEBZ |
SCHEMATIC DIAGRAM DESIGNATOR |
NO COMMON OR GROUNDED ELECTRODE(S) |
| ABKW |
OVERALL HEIGHT |
0.080 INCHES MINIMUM AND 0.100 INCHES MAXIMUM |
| CQBF |
INSULATION RESISTANCE AT MAXIMUM OPERATING TEMP |
10000.0 MEGOHMS |
| CQLZ |
TEMP COEFFICIENT OF CAPACITANCE PER SECTION IN PPM PER DEG CELSIUS |
0.0 SINGLE SECTION |
| ZZZK |
SPECIFICATION/STANDARD DATA |
81349-MIL-C-20/36 GOVERNMENT SPECIFICATION |
| TTQY |
TERMINAL TYPE AND QUANTITY |
2 UNINSULATED WIRE LEAD |
| CWJK |
CASE MATERIAL |
PLASTIC |
| ADAT |
BODY WIDTH |
0.280 INCHES MINIMUM AND 0.300 INCHES MAXIMUM |
| CWQF |
QUALITY FACTOR AT REFERENCE TEMP |
1000.000 |
| AEBT |
TERMINAL DIAMETER |
0.023 INCHES MINIMUM AND 0.029 INCHES MAXIMUM |
| CWSG |
TERMINAL SURFACE TREATMENT |
SOLDER |