| CQJJ |
NONDERATED OPERATING TEMP |
-55.0 DEG CELSIUS MINIMUM AND 125.0 DEG CELSIUS MAXIMUM |
| CQWM |
NONDERATED CONTINUOUS VOLTAGE RATING AND TYPE PER SECTION |
500.0 DC SINGLE SECTION |
| PMLC |
PRECIOUS MATERIAL AND LOCATION |
TERMINALS SILVER AND TERMINAL SURFACES PALLADIUM |
| AARG |
RELIABILITY INDICATOR |
ESTABLISHED |
| TTQY |
TERMINAL TYPE AND QUANTITY |
2 BONDING PAD |
| ADAQ |
BODY LENGTH |
0.110 INCHES NOMINAL |
| ABJT |
TERMINAL LENGTH |
0.015 INCHES NOMINAL |
| CRTP |
TOLERANCE RANGE PER SECTION |
-0.25/+0.25 PICOFARADS SINGLE SECTION |
| CQBQ |
CAPACITANCE VALUE PER SECTION |
1.700 PICOFARADS SINGLE SECTION |
| AAQL |
BODY STYLE |
CHIP TYPE |
| ADAT |
BODY WIDTH |
0.110 INCHES NOMINAL |
| CWPM |
DISSIPATION FACTOR AT REFERENCE TEMP IN PERCENT |
0.050 |
| CWJK |
CASE MATERIAL |
CERAMIC |
| ADAU |
BODY HEIGHT |
0.030 INCHES MINIMUM AND 0.102 INCHES MAXIMUM |
| CWPK |
INSULATION RESISTANCE AT REFERENCE TEMP |
100000.0 MEGOHMS |
| AEBZ |
SCHEMATIC DIAGRAM DESIGNATOR |
NO COMMON OR GROUNDED ELECTRODE(S) |
| CWSG |
TERMINAL SURFACE TREATMENT |
SILVER AND PALLADIUM |
| CRHD |
TOLERANCE OF TEMP COEFFICIENT PER SECTION IN PPM PER DEG CELSIUS |
+70.0/+110.0 SINGLE SECTION |
| AARH |
RELIABILITY FAILURE RATE LEVEL IN PERCENT |
1.000 |
| CQLZ |
TEMP COEFFICIENT OF CAPACITANCE PER SECTION IN PPM PER DEG CELSIUS |
90.0 SINGLE SECTION |
| PRMT |
PRECIOUS MATERIAL |
PALLADIUM AND SILVER |