| CQJJ |
NONDERATED OPERATING TEMP |
-55.0 DEG CELSIUS MINIMUM AND 125.0 DEG CELSIUS MAXIMUM |
| CRHD |
TOLERANCE OF TEMP COEFFICIENT PER SECTION IN PPM PER DEG CELSIUS |
-70.0/+110.0 SINGLE SECTION |
| CWJK |
CASE MATERIAL |
GLASS |
| CQWM |
NONDERATED CONTINUOUS VOLTAGE RATING AND TYPE PER SECTION |
500.0 DC SINGLE SECTION |
| ABKW |
OVERALL HEIGHT |
0.76 MILLIMETERS MINIMUM AND 2.6 MILLIMETERS MAXIMUM |
| TEST |
TEST DATA DOCUMENT |
80063-A3132190 DRAWING |
| TTQY |
TERMINAL TYPE AND QUANTITY |
2 BONDING PAD |
| AARG |
RELIABILITY INDICATOR |
NOT ESTABLISHED |
| CWSG |
TERMINAL SURFACE TREATMENT |
PALLADIUM AND SILVER AND NICKEL |
| ADAQ |
BODY LENGTH |
2.29 MILLIMETERS MINIMUM AND 3.68 MILLIMETERS MAXIMUM |
| AAQL |
BODY STYLE |
CHIP TYPE |
| ABMK |
OVERALL WIDTH |
2.29 MILLIMETERS MINIMUM AND 3.29 MILLIMETERS MAXIMUM |
| CWPM |
DISSIPATION FACTOR AT REFERENCE TEMP IN PERCENT |
0.050 |
| ADAU |
BODY HEIGHT |
0.76 MILLIMETERS MINIMUM AND 2.60 MILLIMETERS MAXIMUM |
| ADAT |
BODY WIDTH |
2.29 MILLIMETERS MINIMUM AND 3.29 MILLIMETERS MAXIMUM |
| AEBZ |
SCHEMATIC DIAGRAM DESIGNATOR |
NO COMMON OR GROUNDED ELECTRODE(S) |
| ABHP |
OVERALL LENGTH |
2.29 MILLIMETERS MINIMUM AND 3.68 MILLIMETERS MAXIMUM |
| CRTP |
TOLERANCE RANGE PER SECTION |
-1.00/+1.00 PERCENT SINGLE SECTION |
| CQLZ |
TEMP COEFFICIENT OF CAPACITANCE PER SECTION IN PPM PER DEG CELSIUS |
90.0 SINGLE SECTION |
| CWPK |
INSULATION RESISTANCE AT REFERENCE TEMP |
10000000.0 MEGOHMS |
| PMLC |
PRECIOUS MATERIAL AND LOCATION |
TERMINALS PALLADIUM AND TERMINALS SURFACES SILVER |
| ABJT |
TERMINAL LENGTH |
0.13 MILLIMETERS MINIMUM AND 0.64 MILLIMETERS MAXIMUM |
| CQBQ |
CAPACITANCE VALUE PER SECTION |
35.000 PICOFARADS SINGLE SECTION |
| CWQF |
QUALITY FACTOR AT REFERENCE TEMP |
3000.000 |
| PRMT |
PRECIOUS MATERIAL |
PALLADIUM AND SILVER |
| CQBF |
INSULATION RESISTANCE AT MAXIMUM OPERATING TEMP |
1000000.0 MEGOHMS |