| CQWM |
NONDERATED CONTINUOUS VOLTAGE RATING AND TYPE PER SECTION |
6.0 DC SINGLE SECTION |
| CQBQ |
CAPACITANCE VALUE PER SECTION |
33.000 MICROFARADS SINGLE SECTION |
| CWQH |
DC LEAKAGE AT REFERENCE TEMP |
2.000 MICROAMPERES |
| TTQY |
TERMINAL TYPE AND QUANTITY |
2 BONDING PAD |
| ADAT |
BODY WIDTH |
1.4 MILLIMETERS MINIMUM AND 1.8 MILLIMETERS MAXIMUM |
| AARG |
RELIABILITY INDICATOR |
NOT ESTABLISHED |
| CRTP |
TOLERANCE RANGE PER SECTION |
-20.00/+20.00 PERCENT SINGLE SECTION |
| AAQL |
BODY STYLE |
CHIP TYPE |
| ADAU |
BODY HEIGHT |
1.5 MILLIMETERS MAXIMUM |
| AEBZ |
SCHEMATIC DIAGRAM DESIGNATOR |
NO COMMON OR GROUNDED ELECTRODE(S) |
| ADAQ |
BODY LENGTH |
3.0 MILLIMETERS MINIMUM AND 3.4 MILLIMETERS MAXIMUM |
| CWQQ |
REFERENCE TEMP AT WHICH RATED |
85.0 DEG CELSIUS |
| AECQ |
ELECTRICAL POLARIZATION |
POLARIZED |
| CWNJ |
CAPACITIVE ELECTRODE MATERIAL |
TANTALUM |
| CXCY |
PART NAME ASSIGNED BY CONTROLLING AGENCY |
SOLID TANTALUM CHIP CAPACITOR |
| CQJJ |
NONDERATED OPERATING TEMP |
85.0 DEG CELSIUS MAXIMUM |