5961-00-451-7507 ( MILS19500-155 , JANTX1N3191 )

NSN Information
NSN FSC NIIN Item Name INC
5961-00-451-7507 5961 004517507 SEMICONDUCTOR DEVICE,DIODE 2058
NSN Features
MRC Parameter Characteristics
TEST TEST DATA DOCUMENT 81349-MIL-S-19500 SPECIFICATION
AXGY MOUNTING METHOD TERMINAL
CTSG MAXIMUM OPERATING TEMP PER MEASUREMENT POINT 175.0 DEG CELSIUS JUNCTION
ABHP OVERALL LENGTH 0.350 INCHES MAXIMUM
ZZZK SPECIFICATION/STANDARD DATA 81349-MIL-S-19500/155 GOVERNMENT SPECIFICATION
ABJT TERMINAL LENGTH 1.000 INCHES MINIMUM
CTMZ SEMICONDUCTOR MATERIAL SILICON
CTQX CURRENT RATING PER CHARACTERISTIC 1.00 AMPERES FORWARD CURRENT, AVERAGE ABSOLUTE
ABBH INCLOSURE MATERIAL GLASS
CBBL FEATURES PROVIDED HERMETICALLY SEALED CASE
ALBA ELECTRODE INTERNALLY-ELECTRICALLY CONNECTED TO CASE CATHODE
CTQN VOLTAGE RATING IN VOLTS PER CHARACTERISTIC 600.0 MAXIMUM REVERSE VOLTAGE, INSTANTANEOUS
TTQY TERMINAL TYPE AND QUANTITY 2 UNINSULATED WIRE LEAD
ADAV OVERALL DIAMETER 0.195 INCHES MINIMUM AND 0.230 INCHES MAXIMUM
Manufacturing Part Numbers (SKUs)
Part SKU Cage Status RNVC RNCC SADC DAC RNAAC
MILS19500-155 81349 M 1 4 3 TX
JANTX1N3191 81349 M 2 2 3 TX
Manufacturers
Part SKU Cage Manufacturer Type Status
MILS19500-155 81349 MILITARY SPECIFICATIONS A M
JANTX1N3191 81349 MILITARY SPECIFICATIONS A M
FLIS Identification
PMIC ADPE Code CRITL Code DEMIL Code DEMIL INTG NIIN Asgt ESD HMIC ENAC Schedule-B INC
U X A 1 05/27/1 N 8541100070 2058
FLIS Management
MOE REC Rep Code Mgmt Ctl USC Phrase Code Phrase Statement
DA A Q2200X- A Z DISCONTINUED-USE 5961-00-403-3298
DN 9B----- N Z DISCONTINUED-USE 5961-00-403-3298
DS I Z DISCONTINUED-USE 5961-00-403-3298
Demilitarization Codes & Management
DML PMI HMIC ADP CC ESDC
A U N X
Miscellaneous Management
MOE (S_A) SOS AAC QUP UI SLC CIIC RC MCC SVC
DN SMS Y 1 EA 0 U 9B----- N
DS SMS Y 1 EA 0 U D
DA SMS Y 1 EA 0 U A Q2200X- A
Management Control Army
MATCAT 1 MATCAT 2 MATCAT 3 MATCAT 4 5 ARC
Q 2 2 00 X
Freight
NMFC NMFC SUB UFC HMC LTL LCL WCC TCC SHC ADC ACC ASH NMF DESC
063025 Z 34525 W 658 Z 9 A H Z SEMICONDUCTORS/DEVICES NOI ETC