| TEST |
TEST DATA DOCUMENT |
81349-MIL-S-19500 SPECIFICATION |
| ALAS |
INTERNAL CONFIGURATION |
POINT CONTACT ALL SEMICONDUCTOR DEVICE DIODE |
| ADAV |
OVERALL DIAMETER |
0.222 INCHES MINIMUM ALL SEMICONDUCTOR DEVICE DIODE AND 0.240 INCHES MAXIMUM ALL SEMICONDUCTOR DEVICE DIODE |
| AFZC |
FUNCTION FOR WHICH DESIGNED |
MICROWAVE AND MIXER |
| PMLC |
PRECIOUS MATERIAL AND LOCATION |
METAL PARTS SURFACES GOLD |
| TTQY |
TERMINAL TYPE AND QUANTITY |
2 PIN ALL SEMICONDUCTOR DEVICE DIODE |
| ABHP |
OVERALL LENGTH |
0.766 INCHES MINIMUM ALL SEMICONDUCTOR DEVICE DIODE AND 0.792 INCHES MAXIMUM ALL SEMICONDUCTOR DEVICE DIODE |
| CBBL |
FEATURES PROVIDED |
BURN IN AND HERMETICALLY SEALED CASE |
| CTSG |
MAXIMUM OPERATING TEMP PER MEASUREMENT POINT |
150.0 DEG CELSIUS AMBIENT AIR ALL SEMICONDUCTOR DEVICE DIODE |
| ABJT |
TERMINAL LENGTH |
0.180 INCHES MINIMUM ALL SEMICONDUCTOR DEVICE DIODE AND 0.190 INCHES MAXIMUM ALL SEMICONDUCTOR DEVICE DIODE |
| ASCQ |
INTERNAL JUNCTION CONFIGURATION |
PN ALL SEMICONDUCTOR DEVICE DIODE |
| ABBH |
INCLOSURE MATERIAL |
GLASS ALL SEMICONDUCTOR DEVICE DIODE |
| ASKA |
COMPONENT NAME AND QUANTITY |
2 SEMICONDUCTOR DEVICE DIODE |
| ASDD |
COMPONENT FUNCTION RELATIONSHIP |
MATCHED |
| ZZZK |
SPECIFICATION/STANDARD DATA |
MIL-S-19500/322 GOVERNMENT SPECIFICATION |
| CTMZ |
SEMICONDUCTOR MATERIAL |
SILICON ALL SEMICONDUCTOR DEVICE DIODE |
| FEAT |
SPECIAL FEATURES |
A REMOVABLE BASE ADAPTER IS FURNISHED FOR EACH DIODE PRMTDAUA000 |
| AXGY |
MOUNTING METHOD |
TERMINAL ALL SEMICONDUCTOR DEVICE DIODE |