5961-01-104-5810 ( C30817 , C30817 , 13043759 )

NSN Information
NSN FSC NIIN Item Name INC
5961-01-104-5810 5961 011045810 SEMICONDUCTOR DEVICE,DIODE 2058
NSN Features
MRC Parameter Characteristics
AFZC FUNCTION FOR WHICH DESIGNED PHOTODIODE
ABHP OVERALL LENGTH 0.185 INCHES MAXIMUM
CTSG MAXIMUM OPERATING TEMP PER MEASUREMENT POINT 60.0 DEG CELSIUS AMBIENT AIR
AXGY MOUNTING METHOD TERMINAL
CTQX CURRENT RATING PER CHARACTERISTIC 5.00 MICROAMPERES REPETITIVE PEAK FORWARD CURRENT PEAK
ABBH INCLOSURE MATERIAL METAL
TEST TEST DATA DOCUMENT 82577-13043759 DRAWING
AYQS TERMINAL CIRCLE DIAMETER 0.210 INCHES MAXIMUM
CTMZ SEMICONDUCTOR MATERIAL SILICON
CTQN VOLTAGE RATING IN VOLTS PER CHARACTERISTIC 350.0 MINIMUM BREAKDOWN VOLTAGE, INSTANTANEOUS
ADAV OVERALL DIAMETER 0.335 INCHES MAXIMUM
ABJT TERMINAL LENGTH 0.500 INCHES MINIMUM
CTRG CAPACITANCE RATING IN PICOFARADS 4.0 MAXIMUM
TTQY TERMINAL TYPE AND QUANTITY 3 UNINSULATED WIRE LEAD
Manufacturing Part Numbers (SKUs)
Part SKU Cage Status RNVC RNCC SADC DAC RNAAC
C30817 34371 A 2 3 5 ZZ
C30817 26720 F 9 5 5 TX
13043759 82577 A 2 7 1 TX
Manufacturers
Part SKU Cage Manufacturer Type Status
C30817 34371 INTERSIL CORPORATION A A
C30817 26720 RCA CORP A F
13043759 82577 RAYTHEON COMPANY F A
FLIS Identification
PMIC ADPE Code CRITL Code DEMIL Code DEMIL INTG NIIN Asgt ESD HMIC ENAC Schedule-B INC
A X A 12/06/1 A N 8541100070 2058
FLIS Management
MOE REC Rep Code Mgmt Ctl USC Phrase Code Phrase Statement
DS I
DA Z Q2200X- A V DISCONTINUED W/O REPLACEMENT
Demilitarization Codes & Management
DML PMI HMIC ADP CC ESDC
A A N X A
Miscellaneous Management
MOE (S_A) SOS AAC QUP UI SLC CIIC RC MCC SVC
DA SMS V 0 EA 0 U Z Q2200X- A
DS SMS J 0 EA 0 U D
Management Control Army
MATCAT 1 MATCAT 2 MATCAT 3 MATCAT 4 5 ARC
Q 2 2 00 X
Freight
NMFC NMFC SUB UFC HMC LTL LCL WCC TCC SHC ADC ACC ASH NMF DESC
063025 Z 34525 W 72D Z 9 A H Z SEMICONDUCTORS/DEVICES NOI ETC