5961-01-117-6469 ( 3214006-001-554 , FSA2509M , FSA2509M , MC1107L )

NSN Information
NSN FSC NIIN Item Name INC
5961-01-117-6469 5961 011176469 SEMICONDUCTOR DEVICES,UNITIZED 6196
NSN Features
MRC Parameter Characteristics
CTSG MAXIMUM OPERATING TEMP PER MEASUREMENT POINT 175.0 DEG CELSIUS AMBIENT AIR
AXGY MOUNTING METHOD TERMINAL
ABHP OVERALL LENGTH 0.785 INCHES MAXIMUM
ABBH INCLOSURE MATERIAL CERAMIC OR PLASTIC
ASKA COMPONENT NAME AND QUANTITY 8 SEMICONDUCTOR DEVICE DIODE
CTQN VOLTAGE RATING IN VOLTS PER CHARACTERISTIC 60.0 MAXIMUM REPETITIVE PEAK REVERSE VOLTAGE ALL SEMICONDUCTOR DEVICE DIODE
CTMZ SEMICONDUCTOR MATERIAL SILICON ALL SEMICONDUCTOR DEVICE DIODE
TTQY TERMINAL TYPE AND QUANTITY 16 UNINSULATED WIRE LEAD
CTQX CURRENT RATING PER CHARACTERISTIC 350.00 MILLIAMPERES SOURCE CUTOFF CURRENT PRESET ALL SEMICONDUCTOR DEVICE DIODE
Manufacturing Part Numbers (SKUs)
Part SKU Cage Status RNVC RNCC SADC DAC RNAAC
3214006-001-554 99696 A 2 3 A TX
FSA2509M 07263 A 9 5 5 TX
FSA2509M 27014 A 9 5 5 TX
MC1107L 04713 A 9 5 3 TX
Manufacturers
Part SKU Cage Manufacturer Type Status
3214006-001-554 99696 LOCKHEED MARTIN CORPORATION A A
FSA2509M 07263 FAIRCHILD SEMICONDUCTOR CORP A A
FSA2509M 27014 NATIONAL SEMICONDUCTOR CORPORATI A A
MC1107L 04713 FREESCALE SEMICONDUCTOR INC. F A
FLIS Identification
PMIC ADPE Code CRITL Code DEMIL Code DEMIL INTG NIIN Asgt ESD HMIC ENAC Schedule-B INC
A X A 08/19/1 B N 8541500080 6196
FLIS Management
MOE REC Rep Code Mgmt Ctl USC Phrase Code Phrase Statement
DS N I
DF N SF9EH-N F
Demilitarization Codes & Management
DML PMI HMIC ADP CC ESDC
A A N X B
Miscellaneous Management
MOE (S_A) SOS AAC QUP UI SLC CIIC RC MCC SVC
DF SMS Z 0 EA 0 U SF9EH-N F
DS SMS Z 0 EA 0 U D
Management Control Army
MATCAT 1 MATCAT 2 MATCAT 3 MATCAT 4 5 ARC
Freight
NMFC NMFC SUB UFC HMC LTL LCL WCC TCC SHC ADC ACC ASH NMF DESC
063025 Z 34525 W 72D 3 9 A H Z SEMICONDUCTORS/DEVICES NOI ETC