| TEST |
TEST DATA DOCUMENT |
81349-MIL-S-19500 SPECIFICATION |
| AXGY |
MOUNTING METHOD |
TERMINAL |
| ZZZK |
SPECIFICATION/STANDARD DATA |
81349-MIL-S-19500/385 GOVERNMENT SPECIFICATION |
| ABJT |
TERMINAL LENGTH |
0.750 INCHES MAXIMUM |
| ALBA |
ELECTRODE INTERNALLY-ELECTRICALLY CONNECTED TO CASE |
GATE |
| CTSG |
MAXIMUM OPERATING TEMP PER MEASUREMENT POINT |
200.0 DEG CELSIUS JUNCTION |
| ABBH |
INCLOSURE MATERIAL |
METAL |
| ALAT |
CHANNEL POLARITY AND CONTROL TYPE (NON-CORE) |
N-CHANNEL JUNCTION TYPE |
| CBBL |
FEATURES PROVIDED |
HERMETICALLY SEALED CASE AND QUALITY ASSURANCE LEVEL S |
| ADAV |
OVERALL DIAMETER |
0.230 INCHES MAXIMUM |
| CTQN |
VOLTAGE RATING IN VOLTS PER CHARACTERISTIC |
40.0 MAXIMUM DRAIN TO SOURCE VOLTAGE AND -40.0 MAXIMUM DRAIN TO GATE VOLTAGE AND 40.0 MAXIMUM GATE TO SOURCE VOLTAGE |
| CTMZ |
SEMICONDUCTOR MATERIAL |
SILICON |
| ABHP |
OVERALL LENGTH |
0.210 INCHES MAXIMUM |
| CTRD |
POWER RATING PER CHARACTERISTIC |
1.8 WATTS SMALL-SIGNAL INPUT POWER, COMMON-COLLECTOR PRESET |
| ALAS |
INTERNAL CONFIGURATION |
FIELD EFFECT |
| CTQX |
CURRENT RATING PER CHARACTERISTIC |
50.00 MILLIAMPERES SOURCE CUTOFF CURRENT MINOR |
| ALAZ |
JOINT ELECTRONIC DEVICE ENGINEERING COUNCIL/JEDEC/CASE OUTLINE DESIGNATION |
TO-18 |
| AYQS |
TERMINAL CIRCLE DIAMETER |
0.100 INCHES NOMINAL |
| TTQY |
TERMINAL TYPE AND QUANTITY |
3 UNINSULATED WIRE LEAD |