| ALAZ |
JOINT ELECTRONIC DEVICE ENGINEERING COUNCIL/JEDEC/CASE OUTLINE DESIGNATION |
TO-3 |
| FEAT |
SPECIAL FEATURES |
ALL SEMICONDUCTOR DEVICE DIODE JUNCTION PATTERN ARRANGEMENT: PN |
| ABBH |
INCLOSURE MATERIAL |
METAL |
| CTSG |
MAXIMUM OPERATING TEMP PER MEASUREMENT POINT |
175.0 DEG CELSIUS JUNCTION |
| CTQN |
VOLTAGE RATING IN VOLTS PER CHARACTERISTIC |
45.0 MAXIMUM WORKING PEAK REVERSE VOLTAGE ALL SEMICONDUCTOR DEVICE DIODE AND 45.0 MAXIMUM REVERSE VOLTAGE, INSTANTANEOUS ALL SEMICONDUCTOR DEVICE DIODE |
| ABHP |
OVERALL LENGTH |
1.573 INCHES MAXIMUM |
| ABKW |
OVERALL HEIGHT |
0.250 INCHES MINIMUM AND 0.450 INCHES MAXIMUM |
| TTQY |
TERMINAL TYPE AND QUANTITY |
2 PIN AND 1 CASE |
| AKPV |
MOUNTING FACILITY QUANTITY |
2 |
| CBBL |
FEATURES PROVIDED |
HERMETICALLY SEALED CASE |
| AFZC |
FUNCTION FOR WHICH DESIGNED |
RECTIFIER |
| ALBA |
ELECTRODE INTERNALLY-ELECTRICALLY CONNECTED TO CASE |
CATHODE |
| SPCL |
SPECIAL TEST FEATURES |
SELECTED AND TESTED FOR THE MILSTAR LRIP PROGRAM |
| ASKA |
COMPONENT NAME AND QUANTITY |
2 SEMICONDUCTOR DEVICE DIODE |
| CTQX |
CURRENT RATING PER CHARACTERISTIC |
30.00 AMPERES FORWARD CURRENT, AVERAGE ABSOLUTE ALL SEMICONDUCTOR DEVICE DIODE AND 500.00 AMPERES FORWARD CURRENT, AVERAGE PRESET ALL SEMICONDUCTOR DEVICE DIODE |
| ABMK |
OVERALL WIDTH |
1.050 INCHES MAXIMUM |
| CTMZ |
SEMICONDUCTOR MATERIAL |
SILICON ALL SEMICONDUCTOR DEVICE DIODE |
| TEST |
TEST DATA DOCUMENT |
49956-G309036 DRAWING |
| AXGY |
MOUNTING METHOD |
UNTHREADED HOLE |