CQSZ |
INCLOSURE CONFIGURATION |
DUAL-IN-LINE |
CTFT |
CASE OUTLINE SOURCE AND DESIGNATOR |
T0-116 JOINT ELECTRON DEVICE ENGINEERING COUNCIL |
AEHX |
MAXIMUM POWER DISSIPATION RATING |
40.0 MILLIWATTS |
ADAU |
BODY HEIGHT |
0.140 INCHES MINIMUM AND 0.180 INCHES MAXIMUM |
AFJQ |
STORAGE TEMP RANGE |
-65.0/+150.0 DEG CELSIUS |
ADAT |
BODY WIDTH |
0.220 INCHES MINIMUM AND 0.280 INCHES MAXIMUM |
CSSL |
DESIGN FUNCTION AND QUANTITY |
1 FLIP-FLOP, CLOCKED AND 1 FLIP-FLOP, J-K, AND INPUT |
CQSJ |
INCLOSURE MATERIAL |
CERAMIC AND GLASS |
CWSG |
TERMINAL SURFACE TREATMENT |
TIN |
CQWX |
OUTPUT LOGIC FORM |
TRANSISTOR-TRANSISTOR LOGIC |
AFGA |
OPERATING TEMP RANGE |
+0.0/+75.0 DEG CELSIUS |
CBBL |
FEATURES PROVIDED |
HERMETICALLY SEALED AND RESETTABLE AND PRESETTABLE AND MONOLITHIC AND POSITIVE OUTPUTS AND W/ENABLE AND NEGATIVE EDGE TRIGGERED AND W/STORAGE |
CQZP |
INPUT CIRCUIT PATTERN |
10 INPUT |
TEST |
TEST DATA DOCUMENT |
07397-32-803726 DRAWING (THIS IS THE BASIC GOVERNING DRAWING, SUCH AS A CONTRACTOR DRAWING, ORIGINAL EQUIPMENT MANUFACTURER DRAWING, ETC.; EXCLUDES ANY SPECIFICATION, STANDARD OR OTHER DOCUMENT THAT MAY BE REFERENCED IN A BASIC GOVERNING DRAWING) |
CZEQ |
TIME RATING PER CHACTERISTIC |
25.00 NANOSECONDS NOMINAL PROPAGATION DELAY TIME, LOW TO HIGH LEVEL OUTPUT AND 13.00 NANOSECONDS NOMINAL PROPAGATION DELAY TIME, HIGH TO LOW LEVEL OUTPUT |
ADAQ |
BODY LENGTH |
0.660 INCHES MINIMUM AND 0.785 INCHES MAXIMUM |