AFGA |
OPERATING TEMP RANGE |
-55.0/+125.0 DEG CELSIUS |
CTFT |
CASE OUTLINE SOURCE AND DESIGNATOR |
T0-85 JOINT ELECTRON DEVICE ENGINEERING COUNCIL |
TEST |
TEST DATA DOCUMENT |
31550-511781 DRAWING (THIS IS THE BASIC GOVERNING DRAWING, SUCH AS A CONTRACTOR DRAWING, ORIGINAL EQUIPMENT MANUFACTURER DRAWING, ETC.; EXCLUDES ANY SPECIFICATION, STANDARD OR OTHER DOCUMENT THAT MAY BE REFERENCED IN A BASIC GOVERNING DRAWING) |
CZEN |
VOLTAGE RATING AND TYPE PER CHARACTERISTIC |
-1.5 VOLTS MINIMUM POWER SOURCE AND 5.5 VOLTS MAXIMUM POWER SOURCE |
CQSZ |
INCLOSURE CONFIGURATION |
FLAT PACK |
TTQY |
TERMINAL TYPE AND QUANTITY |
14 FLAT LEADS |
AFJQ |
STORAGE TEMP RANGE |
-65.0/+150.0 DEG CELSIUS |
ADAU |
BODY HEIGHT |
0.030 INCHES MINIMUM AND 0.070 INCHES MAXIMUM |
CBBL |
FEATURES PROVIDED |
MONOLITHIC AND HERMETICALLY SEALED AND POSITIVE OUTPUTS AND HIGH SPEED AND PRESETTABLE AND W/ENABLE AND NEGATIVE EDGE TRIGGERED AND RESETTABLE |
CSSL |
DESIGN FUNCTION AND QUANTITY |
1 FLIP-FLOP, CLOCKED AND 1 FLIP-FLOP, J-K, AND INPUT |
CQSJ |
INCLOSURE MATERIAL |
CERAMIC AND GLASS |
ADAQ |
BODY LENGTH |
0.240 INCHES MINIMUM AND 0.275 INCHES MAXIMUM |
CQWX |
OUTPUT LOGIC FORM |
TRANSISTOR-TRANSISTOR LOGIC |
CZEQ |
TIME RATING PER CHACTERISTIC |
11.00 NANOSECONDS NOMINAL PROPAGATION DELAY TIME, LOW TO HIGH LEVEL OUTPUT AND 9.00 NANOSECONDS NOMINAL PROPAGATION DELAY TIME, HIGH TO LOW LEVEL OUTPUT |
AEHX |
MAXIMUM POWER DISSIPATION RATING |
50.0 MILLIWATTS |
CQZP |
INPUT CIRCUIT PATTERN |
10 INPUT |
ADAT |
BODY WIDTH |
0.160 INCHES MINIMUM AND 0.185 INCHES MAXIMUM |
CWSG |
TERMINAL SURFACE TREATMENT |
SOLDER |