| CQWX |
OUTPUT LOGIC FORM |
DIODE-TRANSISTOR LOGIC |
| TTQY |
TERMINAL TYPE AND QUANTITY |
10 PIN |
| CQZP |
INPUT CIRCUIT PATTERN |
5 INPUT |
| TEST |
TEST DATA DOCUMENT |
18338-111500 DRAWING (THIS IS THE BASIC GOVERNING DRAWING, SUCH AS A CONTRACTOR DRAWING, ORIGINAL EQUIPMENT MANUFACTURER DRAWING, ETC.; EXCLUDES ANY SPECIFICATION, STANDARD OR OTHER DOCUMENT THAT MAY BE REFERENCED IN A BASIC GOVERNING DRAWING) |
| AFGA |
OPERATING TEMP RANGE |
-5.0/+70.0 DEG CELSIUS |
| CQSJ |
INCLOSURE MATERIAL |
GLASS AND METAL |
| CZEQ |
TIME RATING PER CHACTERISTIC |
20.00 NANOSECONDS MAXIMUM PROPAGATION DELAY TIME, LOW TO HIGH LEVEL OUTPUT AND 20.00 NANOSECONDS MAXIMUM PROPAGATION DELAY TIME, HIGH TO LOW LEVEL OUTPUT |
| CTFT |
CASE OUTLINE SOURCE AND DESIGNATOR |
T0-96 JOINT ELECTRON DEVICE ENGINEERING COUNCIL |
| AFJQ |
STORAGE TEMP RANGE |
-65.0/+150.0 DEG CELSIUS |
| CZEN |
VOLTAGE RATING AND TYPE PER CHARACTERISTIC |
5.5 VOLTS MAXIMUM POWER SOURCE |
| ADAU |
BODY HEIGHT |
0.240 INCHES MINIMUM AND 0.260 INCHES MAXIMUM |
| ADAR |
BODY OUTSIDE DIAMETER |
0.335 INCHES MINIMUM AND 0.370 INCHES MAXIMUM |
| CQSZ |
INCLOSURE CONFIGURATION |
CAN |
| CBBL |
FEATURES PROVIDED |
W/ENABLE AND HERMETICALLY SEALED AND MONOLITHIC AND POSITIVE OUTPUTS |
| CWSG |
TERMINAL SURFACE TREATMENT |
SOLDER |