| CBBL |
FEATURES PROVIDED |
MONOLITHIC AND NEGATIVE OUTPUTS AND POSITIVE OUTPUTS AND BIPOLAR AND HERMETICALLY SEALED AND W/ENABLE AND LOW POWER |
| CQSZ |
INCLOSURE CONFIGURATION |
DUAL-IN-LINE |
| AFGA |
OPERATING TEMP RANGE |
-55.0/+125.0 DEG CELSIUS |
| ADAU |
BODY HEIGHT |
0.165 INCHES MAXIMUM |
| PRMT |
PRECIOUS MATERIAL |
GOLD |
| CQZP |
INPUT CIRCUIT PATTERN |
5 INPUT |
| CQSJ |
INCLOSURE MATERIAL |
GLASS AND METAL |
| CWSG |
TERMINAL SURFACE TREATMENT |
GOLD |
| AEHX |
MAXIMUM POWER DISSIPATION RATING |
174.0 MILLIWATTS |
| CQWX |
OUTPUT LOGIC FORM |
P-TYPE METAL OXIDE-SEMICONDUCTOR LOGIC |
| AFJQ |
STORAGE TEMP RANGE |
-65.0/+150.0 DEG CELSIUS |
| TTQY |
TERMINAL TYPE AND QUANTITY |
16 PRINTED CIRCUIT |
| CRHL |
BIT QUANTITY (NON-CORE) |
1024 |
| ADAT |
BODY WIDTH |
0.280 INCHES MAXIMUM |
| TEST |
TEST DATA DOCUMENT |
96906-MIL-STD-883 STANDARD (INCLUDES INDUSTRY OR ASSOCIATION STANDARDS, INDIVIDUAL MANUFACTUREER STANDARDS, ETC.). |
| ADAQ |
BODY LENGTH |
0.730 INCHES MAXIMUM |
| CZEQ |
TIME RATING PER CHACTERISTIC |
200.00 NANOSECONDS MAXIMUM PROPAGATION DELAY TIME, LOW TO HIGH LEVEL OUTPUT AND 200.00 NANOSECONDS MAXIMUM PROPAGATION DELAY TIME, HIGH TO LOW LEVEL OUTPUT |
| PMLC |
PRECIOUS MATERIAL AND LOCATION |
TERMINALS GOLD AND BODY GOLD |
| CZEN |
VOLTAGE RATING AND TYPE PER CHARACTERISTIC |
0.3 VOLTS MAXIMUM POWER SOURCE |
| CSSL |
DESIGN FUNCTION AND QUANTITY |
2 SHIFT REGISTER, DYNAMIC |