| CSSL |
DESIGN FUNCTION AND QUANTITY |
4 BUFFER |
| PMLC |
PRECIOUS MATERIAL AND LOCATION |
TERMINAL SURFACE GOLD |
| AFGA |
OPERATING TEMP RANGE |
-55.0/+125.0 DEG CELSIUS |
| PRMT |
PRECIOUS MATERIAL |
GOLD |
| TEST |
TEST DATA DOCUMENT |
13499-351-8024 SPECIFICATION (INCLUDES ENGINEERING TYPE BULLETINS, BROCHURES,ETC., THAT REFLECT SPECIFICATION TYPE DATA IN SPECIFICATION FORMAT; EXCLUDES COMMERCIAL CATALOGS, INDUSTRY DIRECTORIES, AND SIMILAR TRADE PUBLICATIONS, REFLECTING GENERAL TYPE DATA ON CERTAIN ENVIRONMENTAL AND PERFORMANCE REQUIREMENTS AND TEST CONDITIONS THAT ARE SHOWN AS "TYPICAL |
| ADAT |
BODY WIDTH |
0.240 INCHES MINIMUM AND 0.270 INCHES MAXIMUM |
| CWSG |
TERMINAL SURFACE TREATMENT |
GOLD |
| CQSZ |
INCLOSURE CONFIGURATION |
FLAT PACK |
| CQWX |
OUTPUT LOGIC FORM |
P-TYPE METAL OXIDE-SEMICONDUCTOR LOGIC |
| TTQY |
TERMINAL TYPE AND QUANTITY |
14 FLAT LEADS |
| AFJQ |
STORAGE TEMP RANGE |
-65.0/+150.0 DEG CELSIUS |
| ADAU |
BODY HEIGHT |
0.030 INCHES MINIMUM AND 0.080 INCHES MAXIMUM |
| CQSJ |
INCLOSURE MATERIAL |
CERAMIC AND GLASS |
| CQZP |
INPUT CIRCUIT PATTERN |
4 INPUT |
| CZEQ |
TIME RATING PER CHACTERISTIC |
150.00 NANOSECONDS MAXIMUM PROPAGATION DELAY TIME, LOW TO HIGH LEVEL OUTPUT AND 150.00 NANOSECONDS MAXIMUM PROPAGATION DELAY TIME, HIGH TO LOW LEVEL OUTPUT |
| CBBL |
FEATURES PROVIDED |
NEGATIVE OUTPUTS AND HERMETICALLY SEALED AND W/BUFFERED OUTPUT |
| AEHX |
MAXIMUM POWER DISSIPATION RATING |
150.0 MILLIWATTS |
| ADAQ |
BODY LENGTH |
0.360 INCHES MINIMUM AND 0.410 INCHES MAXIMUM |
| CZEN |
VOLTAGE RATING AND TYPE PER CHARACTERISTIC |
-15.0 VOLTS MINIMUM POWER SOURCE AND 0.3 VOLTS MAXIMUM POWER SOURCE |