5962-01-010-7812 ( 446/4/04189/175 , HL58965 , 4B77T0208-54S175 , 594067-2 , 537891-1 , 800101-000 , SNC54S175J , 852729-1 , 57-019-4175 , SN74S175J , 7844818 , SN74S175N10 , 389345/4 , 213917G001 , 54S175DMQB , 000-8002-816 , 3002390 , 852729-1 , RB54S175F , 3002390 , 74S175PC , SNC54S175J00 , SN74S175N )

NSN	FSC	NIIN	Item Name	INC
5962-01-010-7812	5962	010107812	MICROCIRCUIT,DIGITAL	3177

MRC	Parameter	Characteristics
CQSZ	INCLOSURE CONFIGURATION	DUAL-IN-LINE
AFGA	OPERATING TEMP RANGE	-55.0/+125.0 DEG CELSIUS
CZEQ	TIME RATING PER CHACTERISTIC	2.00 NANOSECONDS MINIMUM PROPAGATION DELAY TIME, LOW TO HIGH LEVEL OUTPUT AND 20.00 NANOSECONDS MAXIMUM PROPAGATION DELAY TIME, LOW TO HIGH LEVEL OUTPUT
ADAT	BODY WIDTH	0.245 INCHES MINIMUM AND 0.280 INCHES MAXIMUM
ADAQ	BODY LENGTH	0.755 INCHES MINIMUM AND 0.785 INCHES MAXIMUM
ADAU	BODY HEIGHT	0.140 INCHES MINIMUM AND 0.180 INCHES MAXIMUM
AFJQ	STORAGE TEMP RANGE	-65.0/+150.0 DEG CELSIUS
TEST	TEST DATA DOCUMENT	81349-MIL-STD-883 SPECIFICATION (INCLUDES ENGINEERING TYPE BULLETINS, BROCHURES,ETC., THAT REFLECT SPECIFICATION TYPE DATA IN SPECIFICATION FORMAT; EXCLUDES COMMERCIAL CATALOGS, INDUSTRY DIRECTORIES, AND SIMILAR TRADE PUBLICATIONS, REFLECTING GENERAL TYPE DATA ON CERTAIN ENVIRONMENTAL AND PERFORMANCE REQUIREMENTS AND TEST CONDITIONS THAT ARE SHOWN AS "TYPICAL
CQSJ	INCLOSURE MATERIAL	CERAMIC AND GLASS
CQWX	OUTPUT LOGIC FORM	TRANSISTOR-TRANSISTOR LOGIC
CSSL	DESIGN FUNCTION AND QUANTITY	4 FLIP-FLOP, D-TYPE, CLOCKED
CQZP	INPUT CIRCUIT PATTERN	6 INPUT
CBBL	FEATURES PROVIDED	HERMETICALLY SEALED AND MONOLITHIC AND COMPLEMENTARY OUTPUTS AND POSITIVE OUTPUTS AND SCHOTTKY AND W/CLEAR AND EDGE TRIGGERED
AEHX	MAXIMUM POWER DISSIPATION RATING	516.0 MILLIWATTS

Part SKU	Cage	Status	RNVC	RNCC	SADC	DAC	RNAAC
446/4/04189/175	K7034	A	2	5		2	ZK
HL58965	02763	A	9	5		1	TX
4B77T0208-54S175	12456	F	1	C		5	TX
594067-2	49956	A	1	C	AH	5	48
537891-1	96214	A	2	7		2	SB
800101-000	52483	A	1	C		5	48
SNC54S175J	01295	A	2	3		5	SB
852729-1	49956	A	9	5		5	48
57-019-4175	K7810	A	2	5		2	ZK
SN74S175J	01295	A	1	C		9	TU
7844818	03538	A	2	5		2	9Z
SN74S175N10	01295	A	1	C		9	TU
389345/4	00752	A	1	C	AW	1	SB
213917G001	28527	A	1	C	AH	5	48
54S175DMQB	07263	A	2	5		3	TU
000-8002-816	94756	A	2	5		5	TX
3002390	9Y580	A	2	5		4	9Z
852729-1	3B150	A	2	5		5	48
RB54S175F	18324	A	2	5		5	48
3002390	82340	A	9	5		4	9Z
74S175PC	07263	A	1	C	AH	5	48
SNC54S175J00	01295	A	2	3		3	TX
SN74S175N	01295	A	1	C		6	TX

Part SKU	Cage	Manufacturer	Type	Status
446/4/04189/175	K7034	GEFANUC INTELLIGENT PLATFORMS	E	A
HL58965	02763	GRIPPE MACHINING AND MANUFACTURI	A	A
4B77T0208-54S175	12456	AMERICAN STANDARD INC	A	F
594067-2	49956	RAYTHEON COMPANY	A	A
537891-1	96214	RAYTHEON COMPANY	F	A
800101-000	52483	COMMUNICATION SYSTEMS TECHNOLOGY	A	A
SNC54S175J	01295	TEXAS INSTRUMENTS INCORPORATED	A	A
852729-1	49956	RAYTHEON COMPANY	A	A
57-019-4175	K7810	ROCC COMPUTERS LTD	F	A
SN74S175J	01295	TEXAS INSTRUMENTS INCORPORATED	A	A
7844818	03538	LOCKHEED MARTIN CORPORATION	A	A
SN74S175N10	01295	TEXAS INSTRUMENTS INCORPORATED	A	A
389345/4	00752	EDO CORP	A	A
213917G001	28527	ITT CORPORATION	A	A
54S175DMQB	07263	FAIRCHILD SEMICONDUCTOR CORP	A	A
000-8002-816	94756	BOEING COMPANY, THE	F	A
3002390	9Y580	EDO CORPORATION	A	A
852729-1	3B150	RAYTHEON TECHNICAL SERVICES COMP	A	A
RB54S175F	18324	PHILIPS SEMICONDUCTORS INC	A	A
3002390	82340	EDO CORPORATION	A	A
74S175PC	07263	FAIRCHILD SEMICONDUCTOR CORP	A	A
SNC54S175J00	01295	TEXAS INSTRUMENTS INCORPORATED	A	A
SN74S175N	01295	TEXAS INSTRUMENTS INCORPORATED	A	A

PMIC	ADPE Code	CRITL Code	DEMIL Code	DEMIL INTG	NIIN Asgt	ESD	HMIC	ENAC	Schedule-B	INC
A	0	X	B	3	10/06/1	B	N		8542900000	3177

MOE	REC Rep Code	Mgmt Ctl	USC	Phrase Code	Phrase Statement
DN		9N-----	N	Z	DISCONTINUED-USE 5962-01-286-2899

DML	PMI	HMIC	ADP	CC	ESDC
B	A	N	0	X	B

MOE (S_A)	SOS	AAC	QUP	UI	SLC	CIIC	RC	MCC	SVC
DN	S9E	Y	0	EA	0	U		9N-----	N

MATCAT 1	MATCAT 2	MATCAT 3	MATCAT 4 5	ARC

NMFC	NMFC SUB	UFC	HMC	LTL	LCL	WCC	TCC	SHC	ADC	ACC	ASH	NMF DESC
061700	X	35325		J		658	3	5	A	H	Y	ELEC APPLIANCES/INSTRUMENTS NOI