5962-01-027-4795 ( SE527K/883B , 1757-0896 , RB527K , SE527H/883B )

NSN Information
NSN FSC NIIN Item Name INC
5962-01-027-4795 5962 010274795 MICROCIRCUIT,LINEAR 3177
NSN Features
MRC Parameter Characteristics
AFGA OPERATING TEMP RANGE -55.0/+125.0 DEG CELSIUS
TEST TEST DATA DOCUMENT 81349-MIL-STD-883 LEVEL B STANDARD
CQSJ INCLOSURE MATERIAL GLASS AND METAL
CWSG TERMINAL SURFACE TREATMENT GOLD
CBBL FEATURES PROVIDED HERMETICALLY SEALED
AFJQ STORAGE TEMP RANGE -65.0/+150.0 DEG CELSIUS
AEHX MAXIMUM POWER DISSIPATION RATING 600.0 MILLIWATTS
CSSL DESIGN FUNCTION AND QUANTITY 1 COMPARATOR, VOLTAGE
ADAR BODY OUTSIDE DIAMETER 0.370 INCHES NOMINAL
CTFT CASE OUTLINE SOURCE AND DESIGNATOR T0-100 JOINT ELECTRON DEVICE ENGINEERING COUNCIL
CQZP INPUT CIRCUIT PATTERN 6 INPUT
ADAQ BODY LENGTH 0.185 INCHES NOMINAL
CQSZ INCLOSURE CONFIGURATION CAN
Manufacturing Part Numbers (SKUs)
Part SKU Cage Status RNVC RNCC SADC DAC RNAAC
SE527K/883B 18324 A 9 5 5 TX
1757-0896 08241 H 9 3 5 48
RB527K 18324 A 1 C 5 48
SE527H/883B 18324 A 2 5 E TX
Manufacturers
Part SKU Cage Manufacturer Type Status
SE527K/883B 18324 PHILIPS SEMICONDUCTORS INC A A
1757-0896 08241 LOCKHEED MARTIN CORP A H
RB527K 18324 PHILIPS SEMICONDUCTORS INC A A
SE527H/883B 18324 PHILIPS SEMICONDUCTORS INC A A
FLIS Identification
PMIC ADPE Code CRITL Code DEMIL Code DEMIL INTG NIIN Asgt ESD HMIC ENAC Schedule-B INC
G 0 X Q 09/18/1 B N 8542900000 3177
FLIS Management
MOE REC Rep Code Mgmt Ctl USC Phrase Code Phrase Statement
DN 9N----- N Z DISCONTINUED-USE 5962-00-192-3186
Demilitarization Codes & Management
DML PMI HMIC ADP CC ESDC
Q G N 0 X B
Miscellaneous Management
MOE (S_A) SOS AAC QUP UI SLC CIIC RC MCC SVC
DN S9E Y 0 EA 0 U 9N----- N
Management Control Army
MATCAT 1 MATCAT 2 MATCAT 3 MATCAT 4 5 ARC
Freight
NMFC NMFC SUB UFC HMC LTL LCL WCC TCC SHC ADC ACC ASH NMF DESC
061700 X 35325 J 72D Z 9 A H Z ELEC APPLIANCES/INSTRUMENTS NOI