| CQSZ |
INCLOSURE CONFIGURATION |
DUAL-IN-LINE |
| AFGA |
OPERATING TEMP RANGE |
-55.0/+125.0 DEG CELSIUS |
| CBBL |
FEATURES PROVIDED |
W/DISABLE AND W/ENABLE AND DARLINGTON-CONNECTED AND HERMETICALLY SEALED AND MONOLITHIC AND POSITIVE OUTPUTS |
| ADAU |
BODY HEIGHT |
0.100 INCHES MINIMUM AND 0.180 INCHES MAXIMUM |
| CQZP |
INPUT CIRCUIT PATTERN |
14 INPUT |
| CZEQ |
TIME RATING PER CHACTERISTIC |
50.00 NANOSECONDS MAXIMUM PROPAGATION DELAY TIME, LOW TO HIGH LEVEL OUTPUT AND 50.00 NANOSECONDS MAXIMUM PROPAGATION DELAY TIME, HIGH TO LOW LEVEL OUTPUT |
| TTQY |
TERMINAL TYPE AND QUANTITY |
24 PRINTED CIRCUIT |
| AFJQ |
STORAGE TEMP RANGE |
-65.0/+150.0 DEG CELSIUS |
| CRHL |
BIT QUANTITY (NON-CORE) |
4 |
| CZEN |
VOLTAGE RATING AND TYPE PER CHARACTERISTIC |
5.5 VOLTS MAXIMUM POWER SOURCE |
| AEHX |
MAXIMUM POWER DISSIPATION RATING |
455.0 MILLIWATTS |
| CTFT |
CASE OUTLINE SOURCE AND DESIGNATOR |
-0-015-AA JOINT ELECTRON DEVICE ENGINEERING COUNCIL |
| CQSJ |
INCLOSURE MATERIAL |
CERAMIC AND GLASS |
| CQWX |
OUTPUT LOGIC FORM |
TRANSISTOR-TRANSISTOR LOGIC |
| CSWJ |
WORD QUANTITY (NON-CORE) |
2 |
| TEST |
TEST DATA DOCUMENT |
96906-MIL-STD-883 STANDARD (INCLUDES INDUSTRY OR ASSOCIATION STANDARDS, INDIVIDUAL MANUFACTUREER STANDARDS, ETC.). |
| CSSL |
DESIGN FUNCTION AND QUANTITY |
1 ARITHMETIC LOGIC UNIT AND 1 GENERATOR, FUNCTION |
| ADAQ |
BODY LENGTH |
1.200 INCHES MINIMUM AND 1.290 INCHES MAXIMUM |
| ADAT |
BODY WIDTH |
0.515 INCHES MINIMUM AND 0.580 INCHES MAXIMUM |
| CWSG |
TERMINAL SURFACE TREATMENT |
SOLDER |