5962-01-046-9451 ( MC1555G , 900AS2001 , LM555H , SE555T/883B )
NSN Information
| NSN | FSC | NIIN | Item Name | INC |
|---|---|---|---|---|
| 5962-01-046-9451 | 5962 | 010469451 | MICROCIRCUIT,LINEAR | 3177 |
NSN Features
| MRC | Parameter | Characteristics |
|---|---|---|
| AFGA | OPERATING TEMP RANGE | -55.0/+125.0 DEG CELSIUS |
| CBBL | FEATURES PROVIDED | POSITIVE OUTPUTS AND RESETTABLE AND HERMETICALLY SEALED AND MONOLITHIC AND RETRIGGERABLE AND ADJUSTABLE |
| CQSJ | INCLOSURE MATERIAL | GLASS AND METAL |
| TEST | TEST DATA DOCUMENT | 30003-900AS2001 DRAWING (THIS IS THE BASIC GOVERNING DRAWING, SUCH AS A CONTRACTOR DRAWING, ORIGINAL EQUIPMENT MANUFACTURER DRAWING, ETC.; EXCLUDES ANY SPECIFICATION, STANDARD OR OTHER DOCUMENT THAT MAY BE REFERENCED IN A BASIC GOVERNING DRAWING) |
| CTFT | CASE OUTLINE SOURCE AND DESIGNATOR | T0-99 JOINT ELECTRON DEVICE ENGINEERING COUNCIL |
| AFJQ | STORAGE TEMP RANGE | -65.0/+150.0 DEG CELSIUS |
| AEHX | MAXIMUM POWER DISSIPATION RATING | 600.0 MILLIWATTS |
| ADAU | BODY HEIGHT | 0.165 INCHES MINIMUM AND 0.185 INCHES MAXIMUM |
| CQZP | INPUT CIRCUIT PATTERN | 4 INPUT |
| CWSG | TERMINAL SURFACE TREATMENT | TIN |
| CZEQ | TIME RATING PER CHACTERISTIC | 150.00 NANOSECONDS MAXIMUM PROPAGATION DELAY TIME, LOW TO HIGH LEVEL OUTPUT AND 150.00 NANOSECONDS MAXIMUM PROPAGATION DELAY TIME, HIGH TO LOW LEVEL OUTPUT |
| ADAR | BODY OUTSIDE DIAMETER | 0.335 INCHES MINIMUM AND 0.370 INCHES MAXIMUM |
| CQSZ | INCLOSURE CONFIGURATION | CAN |
Manufacturing Part Numbers (SKUs)
| Part SKU | Cage | Status | RNVC | RNCC | SADC | DAC | RNAAC |
|---|---|---|---|---|---|---|---|
| MC1555G | 04713 | A | 1 | 5 | 3 | TX | |
| 900AS2001 | 30003 | A | 2 | 3 | 1 | TX | |
| LM555H | 27014 | A | 1 | 5 | 3 | TX | |
| SE555T/883B | 18324 | A | 1 | 5 | 3 | TX |
Manufacturers
| Part SKU | Cage | Manufacturer | Type | Status |
|---|---|---|---|---|
| MC1555G | 04713 | FREESCALE SEMICONDUCTOR INC. | F | A |
| 900AS2001 | 30003 | NAVAL AIR SYSTEMS COMMAND | A | A |
| LM555H | 27014 | NATIONAL SEMICONDUCTOR CORPORATI | A | A |
| SE555T/883B | 18324 | PHILIPS SEMICONDUCTORS INC | A | A |
FLIS Identification
| PMIC | ADPE Code | CRITL Code | DEMIL Code | DEMIL INTG | NIIN Asgt | ESD | HMIC | ENAC | Schedule-B | INC |
|---|---|---|---|---|---|---|---|---|---|---|
| U | X | Q | 08/26/1 | B | N | 8542900000 | 3177 |
FLIS Management
| MOE | REC Rep Code | Mgmt Ctl | USC | Phrase Code | Phrase Statement |
|---|
Demilitarization Codes & Management
| DML | PMI | HMIC | ADP | CC | ESDC |
|---|
Miscellaneous Management
| MOE (S_A) | SOS | AAC | QUP | UI | SLC | CIIC | RC | MCC | SVC |
|---|
Management Control Army
| MATCAT 1 | MATCAT 2 | MATCAT 3 | MATCAT 4 5 | ARC |
|---|
Freight
| NMFC | NMFC SUB | UFC | HMC | LTL | LCL | WCC | TCC | SHC | ADC | ACC | ASH | NMF DESC |
|---|---|---|---|---|---|---|---|---|---|---|---|---|
| 061700 | X | 35325 | J | 658 | 3 | 5 | A | H | Y | ELEC APPLIANCES/INSTRUMENTS NOI |