| CQSZ |
INCLOSURE CONFIGURATION |
DUAL-IN-LINE |
| PMLC |
PRECIOUS MATERIAL AND LOCATION |
TERMINAL SURFACES GOLD |
| PRMT |
PRECIOUS MATERIAL |
GOLD |
| AFGA |
OPERATING TEMP RANGE |
+0.0/+70.0 DEG CELSIUS |
| CWSG |
TERMINAL SURFACE TREATMENT |
GOLD |
| ADAU |
BODY HEIGHT |
0.090 INCHES MINIMUM AND 0.130 INCHES MAXIMUM |
| CBBL |
FEATURES PROVIDED |
W/BUFFERED OUTPUT AND BIPOLAR AND W/DECODED OUTPUT AND LOW POWER AND W/DISABLE AND W/ENABLE AND 3-STATE OUTPUT AND POSITIVE OUTPUTS AND HERMETICALLY SEALED AND MONOLITHIC AND W/STORAGE |
| ADAQ |
BODY LENGTH |
1.065 INCHES MINIMUM AND 1.095 INCHES MAXIMUM |
| AEHX |
MAXIMUM POWER DISSIPATION RATING |
276.5 MILLIWATTS |
| AFJQ |
STORAGE TEMP RANGE |
-65.0/+150.0 DEG CELSIUS |
| CZEN |
VOLTAGE RATING AND TYPE PER CHARACTERISTIC |
5.5 VOLTS MAXIMUM POWER SOURCE |
| CQZP |
INPUT CIRCUIT PATTERN |
16 INPUT |
| TTQY |
TERMINAL TYPE AND QUANTITY |
22 PRINTED CIRCUIT |
| CZEQ |
TIME RATING PER CHACTERISTIC |
35.00 NANOSECONDS MAXIMUM PROPAGATION DELAY TIME, LOW TO HIGH LEVEL OUTPUT AND 45.00 NANOSECONDS MAXIMUM PROPAGATION DELAY TIME, HIGH TO LOW LEVEL OUTPUT |
| CQWX |
OUTPUT LOGIC FORM |
TRANSISTOR-TRANSISTOR LOGIC |
| CRHL |
BIT QUANTITY (NON-CORE) |
1024 |
| CZZZ |
MEMORY CAPACITY |
UNKNOWN |
| TEST |
TEST DATA DOCUMENT |
96906-MIL-STD-883 STANDARD (INCLUDES INDUSTRY OR ASSOCIATION STANDARDS, INDIVIDUAL MANUFACTUREER STANDARDS, ETC.). |
| ADAT |
BODY WIDTH |
0.380 INCHES MINIMUM AND 0.396 INCHES MAXIMUM |
| CZER |
MEMORY DEVICE TYPE |
ROM |
| CQSJ |
INCLOSURE MATERIAL |
CERAMIC AND METAL |
| CSWJ |
WORD QUANTITY (NON-CORE) |
256 |