| TTQY |
TERMINAL TYPE AND QUANTITY |
10 PIN |
| CQSJ |
INCLOSURE MATERIAL |
GLASS AND METAL |
| CSSL |
DESIGN FUNCTION AND QUANTITY |
2 SHIFT REGISTER, STATIC |
| CQWX |
OUTPUT LOGIC FORM |
P-TYPE METAL OXIDE-SEMICONDUCTOR LOGIC |
| ADAR |
BODY OUTSIDE DIAMETER |
0.355 INCHES MINIMUM AND 0.370 INCHES MAXIMUM |
| AFJQ |
STORAGE TEMP RANGE |
-55.0/+150.0 DEG CELSIUS |
| CZEN |
VOLTAGE RATING AND TYPE PER CHARACTERISTIC |
-14.0 VOLTS MINIMUM POWER SOURCE AND 5.5 VOLTS MAXIMUM POWER SOURCE |
| CBBL |
FEATURES PROVIDED |
MONOLITHIC AND W/ENABLE AND W/BUFFERED OUTPUT AND POSITIVE OUTPUTS AND HERMETICALLY SEALED AND NEGATIVE OUTPUTS AND EDGE TRIGGERED |
| CRHL |
BIT QUANTITY (NON-CORE) |
256 |
| CQZP |
INPUT CIRCUIT PATTERN |
3 INPUT |
| AFGA |
OPERATING TEMP RANGE |
+0.0/+75.0 DEG CELSIUS |
| CQSZ |
INCLOSURE CONFIGURATION |
CAN |
| AGAV |
END ITEM IDENTIFICATION |
TEST SET,@ELECTRONIC CIRCUIT PLUG-IN UNIT,TYPE AN/USM-422 |
| ADAU |
BODY HEIGHT |
0.160 INCHES MINIMUM AND 0.180 INCHES MAXIMUM |
| CWSG |
TERMINAL SURFACE TREATMENT |
SOLDER |
| CZEQ |
TIME RATING PER CHACTERISTIC |
450.00 NANOSECONDS MAXIMUM PROPAGATION DELAY TIME, LOW TO HIGH LEVEL OUTPUT AND 450.00 NANOSECONDS MAXIMUM PROPAGATION DELAY TIME, HIGH TO LOW LEVEL OUTPUT |