| CBBL |
FEATURES PROVIDED |
HERMETICALLY SEALED AND W/STORAGE AND PROGRAMMABLE AND PROGRAMMED AND W/OPEN COLLECTOR AND BIPOLAR AND W/ENABLE AND MONOLITHIC AND POSITIVE OUTPUTS AND W/DECODED OUTPUT |
| CQSZ |
INCLOSURE CONFIGURATION |
DUAL-IN-LINE |
| CRHL |
BIT QUANTITY (NON-CORE) |
2048 |
| ADAQ |
BODY LENGTH |
0.755 INCHES MINIMUM AND 0.790 INCHES MAXIMUM |
| AFJQ |
STORAGE TEMP RANGE |
-65.0/+150.0 DEG CELSIUS |
| CZEN |
VOLTAGE RATING AND TYPE PER CHARACTERISTIC |
5.5 VOLTS MAXIMUM POWER SOURCE |
| ADAU |
BODY HEIGHT |
0.155 INCHES MINIMUM AND 0.175 INCHES MAXIMUM |
| AGAV |
END ITEM IDENTIFICATION |
RADAR SET TYPE AN/FPS-115 |
| TTQY |
TERMINAL TYPE AND QUANTITY |
16 PRINTED CIRCUIT |
| TEST |
TEST DATA DOCUMENT |
04761-640-200061 DRAWING (THIS IS THE BASIC GOVERNING DRAWING, SUCH AS A CONTRACTOR DRAWING, ORIGINAL EQUIPMENT MANUFACTURER DRAWING, ETC.; EXCLUDES ANY SPECIFICATION, STANDARD OR OTHER DOCUMENT THAT MAY BE REFERENCED IN A BASIC GOVERNING DRAWING) |
| CQWX |
OUTPUT LOGIC FORM |
TRANSISTOR-TRANSISTOR LOGIC |
| AFGA |
OPERATING TEMP RANGE |
+0.0/+75.0 DEG CELSIUS |
| CZEQ |
TIME RATING PER CHACTERISTIC |
30.00 NANOSECONDS MAXIMUM PROPAGATION DELAY TIME, LOW TO HIGH LEVEL OUTPUT AND 30.00 NANOSECONDS MAXIMUM PROPAGATION DELAY TIME, HIGH TO LOW LEVEL OUTPUT |
| CZZZ |
MEMORY CAPACITY |
UNKNOWN |
| AEHX |
MAXIMUM POWER DISSIPATION RATING |
650.0 MILLIWATTS |
| CSWJ |
WORD QUANTITY (NON-CORE) |
512 |
| CZER |
MEMORY DEVICE TYPE |
ROM |
| ADAT |
BODY WIDTH |
0.265 INCHES MINIMUM AND 0.300 INCHES MAXIMUM |
| CQZP |
INPUT CIRCUIT PATTERN |
10 INPUT |
| CWSG |
TERMINAL SURFACE TREATMENT |
SOLDER |