| CQSZ |
INCLOSURE CONFIGURATION |
DUAL-IN-LINE |
| AFGA |
OPERATING TEMP RANGE |
-55.0/+125.0 DEG CELSIUS |
| AGAV |
END ITEM IDENTIFICATION |
RADAR SET,TYPE AN/TPS-43E |
| CSWJ |
WORD QUANTITY (NON-CORE) |
32 |
| CZEN |
VOLTAGE RATING AND TYPE PER CHARACTERISTIC |
-1.5 VOLTS MINIMUM POWER SOURCE AND 5.5 VOLTS MAXIMUM POWER SOURCE |
| ADAQ |
BODY LENGTH |
0.808 INCHES MAXIMUM |
| AFJQ |
STORAGE TEMP RANGE |
-65.0/+150.0 DEG CELSIUS |
| CBBL |
FEATURES PROVIDED |
POSITIVE OUTPUTS AND W/BUFFERED OUTPUT AND W/DISABLE AND W/STORAGE AND HIGH SPEED AND W/ENABLE AND HERMETICALLY SEALED AND W/DECODED OUTPUT AND PROGRAMMED AND BIPOLAR AND 3-STATE OUTPUT |
| CZEQ |
TIME RATING PER CHACTERISTIC |
60.00 NANOSECONDS MAXIMUM PROPAGATION DELAY TIME, HIGH TO LOW LEVEL OUTPUT AND 60.00 NANOSECONDS MAXIMUM PROPAGATION DELAY TIME, LOW TO HIGH LEVEL OUTPUT |
| CRHL |
BIT QUANTITY (NON-CORE) |
256 |
| TTQY |
TERMINAL TYPE AND QUANTITY |
16 PRINTED CIRCUIT |
| CQSJ |
INCLOSURE MATERIAL |
CERAMIC AND GLASS |
| CQWX |
OUTPUT LOGIC FORM |
TRANSISTOR-TRANSISTOR LOGIC |
| ADAT |
BODY WIDTH |
0.220 INCHES MINIMUM AND 0.294 INCHES MAXIMUM |
| CZER |
MEMORY DEVICE TYPE |
PROM |
| TEST |
TEST DATA DOCUMENT |
96906-MIL-STD-883 STANDARD |
| CQZP |
INPUT CIRCUIT PATTERN |
6 INPUT |
| ADAU |
BODY HEIGHT |
0.139 INCHES MINIMUM AND 0.204 INCHES MAXIMUM |
| CWSG |
TERMINAL SURFACE TREATMENT |
SOLDER |