| CQSZ |
INCLOSURE CONFIGURATION |
DUAL-IN-LINE |
| AFGA |
OPERATING TEMP RANGE |
-55.0/+125.0 DEG CELSIUS |
| CZEQ |
TIME RATING PER CHACTERISTIC |
70.00 NANOSECONDS MAXIMUM PROPAGATION DELAY TIME, LOW TO HIGH LEVEL OUTPUT AND 70.00 NANOSECONDS MAXIMUM PROPAGATION DELAY TIME, HIGH TO LOW LEVEL OUTPUT |
| ADAU |
BODY HEIGHT |
0.145 INCHES MINIMUM AND 0.170 INCHES MAXIMUM |
| CQZP |
INPUT CIRCUIT PATTERN |
12 INPUT |
| CBBL |
FEATURES PROVIDED |
W/ENABLE AND HERMETICALLY SEALED AND PROGRAMMABLE AND 3-STATE OUTPUT AND SCHOTTKY AND WIRE-OR OUTPUTS |
| AFJQ |
STORAGE TEMP RANGE |
-65.0/+150.0 DEG CELSIUS |
| ADAQ |
BODY LENGTH |
0.880 INCHES MINIMUM AND 0.900 INCHES MAXIMUM |
| CQSJ |
INCLOSURE MATERIAL |
CERAMIC |
| ADAT |
BODY WIDTH |
0.285 INCHES MINIMUM AND 0.300 INCHES MAXIMUM |
| CRHL |
BIT QUANTITY (NON-CORE) |
4096 |
| CQWX |
OUTPUT LOGIC FORM |
TRANSISTOR-TRANSISTOR LOGIC |
| TEST |
TEST DATA DOCUMENT |
96906-MIL-STD-883 STANDARD (INCLUDES INDUSTRY OR ASSOCIATION STANDARDS, INDIVIDUAL MANUFACTUREER STANDARDS, ETC.). |
| AEHX |
MAXIMUM POWER DISSIPATION RATING |
650.0 MILLIWATTS |
| CSWJ |
WORD QUANTITY (NON-CORE) |
1024 |