| CQSZ |
INCLOSURE CONFIGURATION |
DUAL-IN-LINE |
| ADAT |
BODY WIDTH |
0.288 INCHES MAXIMUM |
| CRHL |
BIT QUANTITY (NON-CORE) |
128 |
| CQZP |
INPUT CIRCUIT PATTERN |
7 INPUT |
| CSSL |
DESIGN FUNCTION AND QUANTITY |
2 SHIFT REGISTER, STATIC |
| ADAU |
BODY HEIGHT |
0.140 INCHES MINIMUM AND 0.180 INCHES MAXIMUM |
| CQWX |
OUTPUT LOGIC FORM |
P-TYPE METAL OXIDE-SEMICONDUCTOR LOGIC |
| CZEQ |
TIME RATING PER CHACTERISTIC |
350.00 NANOSECONDS MAXIMUM PROPAGATION DELAY TIME, LOW TO HIGH LEVEL OUTPUT AND 350.00 NANOSECONDS MAXIMUM PROPAGATION DELAY TIME, HIGH TO LOW LEVEL OUTPUT |
| AFJQ |
STORAGE TEMP RANGE |
-55.0/+150.0 DEG CELSIUS |
| ADAQ |
BODY LENGTH |
0.785 INCHES MAXIMUM |
| TEST |
TEST DATA DOCUMENT |
49956-714208 DRAWING (THIS IS THE BASIC GOVERNING DRAWING, SUCH AS A CONTRACTOR DRAWING, ORIGINAL EQUIPMENT MANUFACTURER DRAWING, ETC.; EXCLUDES ANY SPECIFICATION, STANDARD OR OTHER DOCUMENT THAT MAY BE REFERENCED IN A BASIC GOVERNING DRAWING) |
| TTQY |
TERMINAL TYPE AND QUANTITY |
16 PRINTED CIRCUIT |
| CQSJ |
INCLOSURE MATERIAL |
CERAMIC AND GLASS |
| AEHX |
MAXIMUM POWER DISSIPATION RATING |
360.0 MILLIWATTS |
| CZEN |
VOLTAGE RATING AND TYPE PER CHARACTERISTIC |
0.3 VOLTS MAXIMUM POWER SOURCE |
| AFGA |
OPERATING TEMP RANGE |
-25.0/+85.0 DEG CELSIUS |
| CWSG |
TERMINAL SURFACE TREATMENT |
SOLDER |
| CBBL |
FEATURES PROVIDED |
W/ENABLE AND MONOLITHIC AND HERMETICALLY SEALED AND POSITIVE OUTPUTS AND W/STORAGE |