| CQSZ |
INCLOSURE CONFIGURATION |
DUAL-IN-LINE |
| AFGA |
OPERATING TEMP RANGE |
-55.0/+125.0 DEG CELSIUS |
| TEST |
TEST DATA DOCUMENT |
81755-654+5501 DRAWING |
| CQZP |
INPUT CIRCUIT PATTERN |
12 INPUT |
| CZEQ |
TIME RATING PER CHACTERISTIC |
85.00 NANOSECONDS MAXIMUM PROPAGATION DELAY TIME, LOW TO HIGH LEVEL OUTPUT AND 85.00 NANOSECONDS MAXIMUM PROPAGATION DELAY TIME, HIGH TO LOW LEVEL OUTPUT |
| AFJQ |
STORAGE TEMP RANGE |
-65.0/+150.0 DEG CELSIUS |
| ADAU |
BODY HEIGHT |
0.140 INCHES MINIMUM AND 0.185 INCHES MAXIMUM |
| CZEN |
VOLTAGE RATING AND TYPE PER CHARACTERISTIC |
-0.5 VOLTS MINIMUM POWER SOURCE AND 7.0 VOLTS MAXIMUM POWER SOURCE |
| AEHX |
MAXIMUM POWER DISSIPATION RATING |
794.0 MILLIWATTS |
| CRHL |
BIT QUANTITY (NON-CORE) |
4096 |
| CQSJ |
INCLOSURE MATERIAL |
CERAMIC AND GLASS |
| CQWX |
OUTPUT LOGIC FORM |
TRANSISTOR-TRANSISTOR LOGIC |
| CZER |
MEMORY DEVICE TYPE |
PROM |
| ADAQ |
BODY LENGTH |
0.940 INCHES MAXIMUM |
| AGAV |
END ITEM IDENTIFICATION |
TRAINING SET,ELECTRONIC WARFARE,TYPE AN/MST-T1 |
| ADAT |
BODY WIDTH |
0.220 INCHES MINIMUM AND 0.310 INCHES MAXIMUM |
| TTQY |
TERMINAL TYPE AND QUANTITY |
18 PRINTED CIRCUIT |
| CBBL |
FEATURES PROVIDED |
MONOLITHIC AND POSITIVE OUTPUTS AND 3-STATE OUTPUT AND BIPOLAR AND PROGRAMMABLE AND HERMETICALLY SEALED AND SCHOTTKY |
| CSWJ |
WORD QUANTITY (NON-CORE) |
1024 |
| CWSG |
TERMINAL SURFACE TREATMENT |
SOLDER |