| CQSZ |
INCLOSURE CONFIGURATION |
DUAL-IN-LINE |
| AFGA |
OPERATING TEMP RANGE |
-55.0/+125.0 DEG CELSIUS |
| CBBL |
FEATURES PROVIDED |
MONOLITHIC AND HERMETICALLY SEALED AND BURN IN, MIL-STD-883, CLASS B AND NEGATIVE OUTPUTS AND HIGH SPEED |
| ADAT |
BODY WIDTH |
0.245 INCHES MINIMUM AND 0.275 INCHES MAXIMUM |
| CQZP |
INPUT CIRCUIT PATTERN |
5 INPUT |
| CQWX |
OUTPUT LOGIC FORM |
EMITTER-COUPLED LOGIC |
| ADAQ |
BODY LENGTH |
0.750 INCHES MINIMUM AND 0.780 INCHES MAXIMUM |
| ADAU |
BODY HEIGHT |
0.120 INCHES MINIMUM AND 0.180 INCHES MAXIMUM |
| CZEN |
VOLTAGE RATING AND TYPE PER CHARACTERISTIC |
-8.0 VOLTS MINIMUM POWER SOURCE AND 0.0 VOLTS MAXIMUM POWER SOURCE |
| AGAV |
END ITEM IDENTIFICATION |
4920-01-094-8835 FSCM 03640 |
| CSSL |
DESIGN FUNCTION AND QUANTITY |
2 DECODER |
| AFJQ |
STORAGE TEMP RANGE |
-65.0/+150.0 DEG CELSIUS |
| AEHX |
MAXIMUM POWER DISSIPATION RATING |
330.0 MILLIWATTS |
| TTQY |
TERMINAL TYPE AND QUANTITY |
16 PRINTED CIRCUIT |
| CQSJ |
INCLOSURE MATERIAL |
CERAMIC AND GLASS |
| TEST |
TEST DATA DOCUMENT |
96906-MIL-STD-883 STANDARD (INCLUDES INDUSTRY OR ASSOCIATION STANDARDS, INDIVIDUAL MANUFACTUREER STANDARDS, ETC.). |
| CZEQ |
TIME RATING PER CHACTERISTIC |
4.00 NANOSECONDS MAXIMUM PROPAGATION DELAY TIME, LOW TO HIGH LEVEL OUTPUT AND 4.00 NANOSECONDS MAXIMUM PROPAGATION DELAY TIME, HIGH TO LOW LEVEL OUTPUT |
| CWSG |
TERMINAL SURFACE TREATMENT |
SOLDER |