5962-01-171-3774 ( CD54HC32F/3 , MC74HC32N , SN54HC32J , M470223 , CD54HC32F , 915018 , MC74HC32N , MM54HC-32J/883 , CM38-32A , SNJ54HC32J , MC54HC32J , 351-8804-130 , I15-0000-032 , 447432 , MM54HC32J/883B , 99124253 , CM38-32A , 1820-3298 , 405578-1 , 360400 , MM54HC32J-MIL , 54HC32/BCBJC , ES5760-01 )

NSN	FSC	NIIN	Item Name	INC
5962-01-171-3774	5962	011713774	MICROCIRCUIT,DIGITAL	3177

MRC	Parameter	Characteristics
CQSZ	INCLOSURE CONFIGURATION	DUAL-IN-LINE
AFGA	OPERATING TEMP RANGE	-55.0/+125.0 DEG CELSIUS
CBBL	FEATURES PROVIDED	HERMETICALLY SEALED AND HIGH SPEED AND LOW POWER
CZEN	VOLTAGE RATING AND TYPE PER CHARACTERISTIC	18.3 VOLTS MAXIMUM POWER SOURCE
TTQY	TERMINAL TYPE AND QUANTITY	14 PRINTED CIRCUIT
AEHX	MAXIMUM POWER DISSIPATION RATING	500.0 MILLIWATTS
CSSL	DESIGN FUNCTION AND QUANTITY	4 GATE, OR
AFJQ	STORAGE TEMP RANGE	-65.0/+150.0 DEG CELSIUS
ADAQ	BODY LENGTH	0.785 INCHES MAXIMUM
CQSJ	INCLOSURE MATERIAL	CERAMIC AND GLASS
CQWX	OUTPUT LOGIC FORM	COMPLEMENTARY-METAL OXIDE-SEMICONDUCTOR LOGIC
CZEQ	TIME RATING PER CHACTERISTIC	150.00 NANOSECONDS MAXIMUM PROPAGATION DELAY TIME, LOW TO HIGH LEVEL OUTPUT AND 150.00 NANOSECONDS MAXIMUM PROPAGATION DELAY TIME, HIGH TO LOW LEVEL OUTPUT
CQZP	INPUT CIRCUIT PATTERN	QUAD 2 INPUT
TEST	TEST DATA DOCUMENT	96906-MIL-STD-883 STANDARD (INCLUDES INDUSTRY OR ASSOCIATION STANDARDS, INDIVIDUAL MANUFACTUREER STANDARDS, ETC.).
ADAU	BODY HEIGHT	0.160 INCHES MAXIMUM
CWSG	TERMINAL SURFACE TREATMENT	SOLDER
ADAT	BODY WIDTH	0.310 INCHES MAXIMUM

Part SKU	Cage	Status	RNVC	RNCC	SADC	DAC	RNAAC
CD54HC32F/3	18714	A	1	C	AC	6	ZZ
MC74HC32N	F4597	Y	2	5		4	ZF
SN54HC32J	01295	A	1	5		5	TX
M470223	50655	H	1	C	AC	6	ZZ
CD54HC32F	34371	A	2	5		5	TX
915018	80249	A	2	5		6	9Z
MC74HC32N	04713	A	1	C	AF	5	TX
MM54HC-32J/883	27014	A	1	C	AC	6	ZZ
CM38-32A	08478	H	1	C	AC	6	ZZ
SNJ54HC32J	01295	A	2	5		E	TX
MC54HC32J	04713	A	9	5		E	TX
351-8804-130	13499	A	1	5		5	TX
I15-0000-032	14304	A	2	5		5	TX
447432	1L442	A	2	5		5	TX
MM54HC32J/883B	27014	A	2	3		E	TX
99124253	F0053	R	2	5		2	ZF
CM38-32A	08748	A	1	C	AF	5	TX
1820-3298	1LQK8	A	1	C	AC	6	ZZ
405578-1	55974	A	2	5		5	TX
360400	16067	A	2	5		5	TX
MM54HC32J-MIL	27014	A	2	5		6	KE
54HC32/BCBJC	04713	A	1	C	AF	5	TX
ES5760-01	20418	C	2	5		A	TX

Part SKU	Cage	Manufacturer	Type	Status
CD54HC32F/3	18714	HARRIS CORP	A	A
MC74HC32N	F4597	FREESCALE SEMICONDUCTEURS FRANCE	E	Y
SN54HC32J	01295	TEXAS INSTRUMENTS INCORPORATED	A	A
M470223	50655	QUALIMETRICS INC	A	H
CD54HC32F	34371	INTERSIL CORPORATION	A	A
915018	80249	BAE SYSTEMS INFORMATION AND	A	A
MC74HC32N	04713	FREESCALE SEMICONDUCTOR INC.	F	A
MM54HC-32J/883	27014	NATIONAL SEMICONDUCTOR CORPORATI	A	A
CM38-32A	08478	GARDNER-DENVER CO CANADA LTD	A	H
SNJ54HC32J	01295	TEXAS INSTRUMENTS INCORPORATED	A	A
MC54HC32J	04713	FREESCALE SEMICONDUCTOR INC.	F	A
351-8804-130	13499	ROCKWELL COLLINS INC.	F	A
I15-0000-032	14304	HARRIS CORPORATION	A	A
447432	1L442	MEDICAL RESEARCH LABORATORIES IN	A	A
MM54HC32J/883B	27014	NATIONAL SEMICONDUCTOR CORPORATI	A	A
99124253	F0053	THALES COMMUNICATIONS	E	R
CM38-32A	08748	ELDEC CORPORATION	A	A
1820-3298	1LQK8	AGILENT TECHNOLOGIES INC.	A	A
405578-1	55974	HONEYWELL INTL INC	A	A
360400	16067	CALIFORNIA INSTRUMENTS CORP	A	A
MM54HC32J-MIL	27014	NATIONAL SEMICONDUCTOR CORPORATI	A	A
54HC32/BCBJC	04713	FREESCALE SEMICONDUCTOR INC.	F	A
ES5760-01	20418	DRS SUSTAINMENT SYSTEMS INC.	A	C

PMIC	ADPE Code	CRITL Code	DEMIL Code	DEMIL INTG	NIIN Asgt	ESD	HMIC	ENAC	Schedule-B	INC
A	0	X	Q		02/07/1	B	N		8542900000	3177

MOE	REC Rep Code	Mgmt Ctl	USC
DA	Z	Q2200X-	A
DF	N	SF9EH-N	F
DS	N		I
DN		9B-----	N
DM	Z	15B2--1	M

DML	PMI	HMIC	ADP	CC	ESDC
Q	A	N	0	X	B

MOE (S_A)	SOS	AAC	QUP	UI	CIIC	RC	MCC	SVC
DM	SMS	Z	1	EA	U	Z	15B2--1	M
DF	SMS	Z	1	EA	U		SF9EH-N	F
DN	SMS	Z	1	EA	U		9B-----	N
DS	SMS	Z	1	EA	U			D
DA	SMS	Z	1	EA	U	Z	Q2200X-	A

MATCAT 1	MATCAT 2	MATCAT 3	MATCAT 4 5	ARC
Q	2	2	00	X

NMFC	NMFC SUB	UFC	HMC	LTL	LCL	WCC	TCC	SHC	ADC	ACC	ASH	NMF DESC
061700	X	35325		J		72D	3	9	A	H	Z	ELEC APPLIANCES/INSTRUMENTS NOI