| CQSZ |
INCLOSURE CONFIGURATION |
DUAL-IN-LINE |
| AFGA |
OPERATING TEMP RANGE |
-55.0/+125.0 DEG CELSIUS |
| CZEQ |
TIME RATING PER CHACTERISTIC |
300.00 NANOSECONDS MAXIMUM PROPAGATION DELAY TIME, LOW TO HIGH LEVEL OUTPUT AND 300.00 NANOSECONDS MAXIMUM PROPAGATION DELAY TIME, HIGH TO LOW LEVEL OUTPUT |
| TTQY |
TERMINAL TYPE AND QUANTITY |
28 PRINTED CIRCUIT |
| AGAV |
END ITEM IDENTIFICATION |
LANDING CRAFT AIR CUSHION (LCAC), TARAWA CLASS LHA, NIMITZ CLASS CVN, FORRESTAL CLASS CV, EMORY S. LAND, WASP CLASS LHD. B-1B AIRCRAFT. 2M/ATE MICROMINIAUTURE AUTOMATIC TEST EQUIPMENT. |
| CBBL |
FEATURES PROVIDED |
3-STATE OUTPUT AND HERMETICALLY SEALED AND PROGRAMMABLE AND ULTRAVIOLET ERASABLE |
| AFJQ |
STORAGE TEMP RANGE |
-65.0/+150.0 DEG CELSIUS |
| ADAU |
BODY HEIGHT |
0.140 INCHES MINIMUM AND 0.185 INCHES MAXIMUM |
| CSWJ |
WORD QUANTITY (NON-CORE) |
8192 |
| CQZP |
INPUT CIRCUIT PATTERN |
16 INPUT |
| CQSJ |
INCLOSURE MATERIAL |
CERAMIC AND GLASS |
| TEST |
TEST DATA DOCUMENT |
96906-MIL-STD-883 STANDARD |
| CRHL |
BIT QUANTITY (NON-CORE) |
65536 |
| ADAT |
BODY WIDTH |
0.610 INCHES MAXIMUM |
| ADAQ |
BODY LENGTH |
1.460 INCHES NOMINAL |
| CQWX |
OUTPUT LOGIC FORM |
N-TYPE METAL OXIDE-SEMICONDUCTOR LOGIC |
| CZER |
MEMORY DEVICE TYPE |
ROM |
| CZEN |
VOLTAGE RATING AND TYPE PER CHARACTERISTIC |
-0.6 VOLTS MINIMUM POWER SOURCE AND 22.0 VOLTS MAXIMUM POWER SOURCE |
| CWSG |
TERMINAL SURFACE TREATMENT |
SOLDER |