| CQSZ |
INCLOSURE CONFIGURATION |
DUAL-IN-LINE |
| AFGA |
OPERATING TEMP RANGE |
-55.0/+125.0 DEG CELSIUS |
| CQZP |
INPUT CIRCUIT PATTERN |
8 STAGE AND 6 INPUT |
| ADAQ |
BODY LENGTH |
0.750 INCHES MINIMUM AND 0.785 INCHES MAXIMUM |
| CSSL |
DESIGN FUNCTION AND QUANTITY |
2 SHIFT REGISTER, STATIC |
| ADAT |
BODY WIDTH |
0.240 INCHES MINIMUM AND 0.295 INCHES MAXIMUM |
| CZEQ |
TIME RATING PER CHACTERISTIC |
750.00 NANOSECONDS MAXIMUM PROPAGATION DELAY TIME, LOW TO HIGH LEVEL OUTPUT AND 750.00 NANOSECONDS MAXIMUM PROPAGATION DELAY TIME, HIGH TO LOW LEVEL OUTPUT |
| AFJQ |
STORAGE TEMP RANGE |
-55.0/+150.0 DEG CELSIUS |
| CQSJ |
INCLOSURE MATERIAL |
CERAMIC |
| CZEN |
VOLTAGE RATING AND TYPE PER CHARACTERISTIC |
18.0 VOLTS MAXIMUM POWER SOURCE |
| TTQY |
TERMINAL TYPE AND QUANTITY |
16 PRINTED CIRCUIT |
| CQWX |
OUTPUT LOGIC FORM |
COMPLEMENTARY-METAL OXIDE-SEMICONDUCTOR LOGIC |
| TEST |
TEST DATA DOCUMENT |
96906-MIL-STD-883 STANDARD |
| ADAU |
BODY HEIGHT |
0.180 INCHES MAXIMUM |
| CBBL |
FEATURES PROVIDED |
W/RESET AND W/COMMON CLOCK AND STATIC OPERATION AND HIGH IMPEDANCE AND BURN IN AND HERMETICALLY SEALED AND HIGH FAN-OUT AND W/BUFFERED OUTPUT AND ELECTROSTATIC SENSITIVE AND BUFFERED RESET AND MONOLITHIC AND POSITIVE EDGE TRIGGERED AND 2-STATE OUTPUT |
| CWSG |
TERMINAL SURFACE TREATMENT |
SOLDER |
| CRHL |
BIT QUANTITY (NON-CORE) |
8 |