| CQSZ |
INCLOSURE CONFIGURATION |
DUAL-IN-LINE |
| AFGA |
OPERATING TEMP RANGE |
-55.0/+125.0 DEG CELSIUS |
| ADAQ |
BODY LENGTH |
1.290 INCHES MAXIMUM |
| CQZP |
INPUT CIRCUIT PATTERN |
DUAL 7 INPUT |
| ADAU |
BODY HEIGHT |
0.230 INCHES MAXIMUM |
| AEHX |
MAXIMUM POWER DISSIPATION RATING |
500.0 MILLIWATTS |
| TTQY |
TERMINAL TYPE AND QUANTITY |
24 PRINTED CIRCUIT |
| AFJQ |
STORAGE TEMP RANGE |
-65.0/+150.0 DEG CELSIUS |
| CRHL |
BIT QUANTITY (NON-CORE) |
4 |
| FEAT |
SPECIAL FEATURES |
ITEM MUST COMPLY WITH REQUIREMENTS OF DEFENSE ELECTRONICS SUPPLY CENTER PRODUCTION STANDARD NO. L03819; FOR NAVY NUCLEAR PROPULSION PLANT PRODUCTS ONLY |
| CTFT |
CASE OUTLINE SOURCE AND DESIGNATOR |
MO-015AA JOINT ELECTRON DEVICE ENGINEERING COUNCIL |
| CZEN |
VOLTAGE RATING AND TYPE PER CHARACTERISTIC |
-0.5 VOLTS MINIMUM POWER SOURCE AND 7.0 VOLTS MAXIMUM POWER SOURCE |
| CQSJ |
INCLOSURE MATERIAL |
CERAMIC |
| ADAT |
BODY WIDTH |
0.580 INCHES MAXIMUM |
| CBBL |
FEATURES PROVIDED |
W/RESET AND W/STROBE AND BURN IN AND HERMETICALLY SEALED AND 3-STATE OUTPUT |
| CQWX |
OUTPUT LOGIC FORM |
COMPLEMENTARY-METAL OXIDE-SEMICONDUCTOR LOGIC |
| TEST |
TEST DATA DOCUMENT |
96906-MIL-STD-883 STANDARD (INCLUDES INDUSTRY OR ASSOCIATION STANDARDS, INDIVIDUAL MANUFACTUREER STANDARDS, ETC.). |
| CSSL |
DESIGN FUNCTION AND QUANTITY |
2 LATCH |
| CRTL |
CRITICALITY CODE JUSTIFICATION |
FEAT |
| CWSG |
TERMINAL SURFACE TREATMENT |
SOLDER |