| CQSZ |
INCLOSURE CONFIGURATION |
DUAL-IN-LINE |
| CTQX |
CURRENT RATING PER CHARACTERISTIC |
16.00 MILLIAMPERES AVERAGE FORWARD CURRENT AVERAGED OVER A FULL 60-HZ CYCLE NOT APPLICABLE |
| AFGA |
OPERATING TEMP RANGE |
-55.0/+125.0 DEG CELSIUS |
| ABKW |
OVERALL HEIGHT |
0.330 INCHES NOMINAL |
| ABHP |
OVERALL LENGTH |
0.930 INCHES MINIMUM AND 0.975 INCHES MAXIMUM |
| ADAQ |
BODY LENGTH |
0.930 INCHES MINIMUM AND 0.975 INCHES MAXIMUM |
| ADAU |
BODY HEIGHT |
0.180 INCHES NOMINAL |
| AEHX |
MAXIMUM POWER DISSIPATION RATING |
500.0 MILLIWATTS |
| TTQY |
TERMINAL TYPE AND QUANTITY |
20 PRINTED CIRCUIT |
| ADAT |
BODY WIDTH |
0.245 INCHES MINIMUM AND 0.300 INCHES MAXIMUM |
| AFJQ |
STORAGE TEMP RANGE |
-65.0/+150.0 DEG CELSIUS |
| CBBL |
FEATURES PROVIDED |
3-STATE OUTPUT AND LOW VOLTAGE AND PROGRAMMED AND MONOLITHIC AND SCHOTTKY |
| CQSJ |
INCLOSURE MATERIAL |
CERAMIC |
| CZEN |
VOLTAGE RATING AND TYPE PER CHARACTERISTIC |
7.0 VOLTS MAXIMUM POWER SOURCE |
| CRHL |
BIT QUANTITY (NON-CORE) |
4096 |
| CQWX |
OUTPUT LOGIC FORM |
TRANSISTOR-TRANSISTOR LOGIC |
| CZER |
MEMORY DEVICE TYPE |
PROM |
| TEST |
TEST DATA DOCUMENT |
96906-MIL-STD-883 STANDARD |
| CZEQ |
TIME RATING PER CHACTERISTIC |
70.00 NANOSECONDS MAXIMUM ACCESS |
| CSWJ |
WORD QUANTITY (NON-CORE) |
512 |
| CQZP |
INPUT CIRCUIT PATTERN |
10 INPUT |
| CWSG |
TERMINAL SURFACE TREATMENT |
SOLDER |