| CZEQ |
TIME RATING PER CHACTERISTIC |
100.00 NANOSECONDS MAXIMUM PROPAGATION DELAY TIME, LOW TO HIGH LEVEL OUTPUT AND 100.00 NANOSECONDS MAXIMUM PROPAGATION DELAY TIME, HIGH TO LOW LEVEL OUTPUT |
| CQSZ |
INCLOSURE CONFIGURATION |
DUAL-IN-LINE |
| AFGA |
OPERATING TEMP RANGE |
-55.0/+125.0 DEG CELSIUS |
| CBBL |
FEATURES PROVIDED |
BURN IN AND HERMETICALLY SEALED AND LOW POWER AND BIDIRECTIONAL AND W/ENABLE |
| ADAT |
BODY WIDTH |
0.550 INCHES MINIMUM AND 0.610 INCHES MAXIMUM |
| CRHL |
BIT QUANTITY (NON-CORE) |
8192 |
| AGAV |
END ITEM IDENTIFICATION |
RECEIVER SET,INFRARED WARNING AN/AAR-44 |
| AFJQ |
STORAGE TEMP RANGE |
-65.0/+150.0 DEG CELSIUS |
| CZEN |
VOLTAGE RATING AND TYPE PER CHARACTERISTIC |
-0.5 VOLTS MINIMUM POWER SOURCE AND 7.0 VOLTS MAXIMUM POWER SOURCE |
| TTQY |
TERMINAL TYPE AND QUANTITY |
48 PRINTED CIRCUIT |
| CQSJ |
INCLOSURE MATERIAL |
CERAMIC |
| ADAU |
BODY HEIGHT |
0.030 INCHES MINIMUM AND 0.170 INCHES MAXIMUM |
| ADAQ |
BODY LENGTH |
2.370 INCHES MINIMUM AND 2.430 INCHES MAXIMUM |
| CQWX |
OUTPUT LOGIC FORM |
COMPLEMENTARY-METAL OXIDE-SEMICONDUCTOR LOGIC |
| TEST |
TEST DATA DOCUMENT |
96906-MIL-STD-883 STANDARD |
| AEHX |
MAXIMUM POWER DISSIPATION RATING |
1.5 WATTS |
| CZER |
MEMORY DEVICE TYPE |
ROM |
| CQZP |
INPUT CIRCUIT PATTERN |
44 INPUT |
| CSWJ |
WORD QUANTITY (NON-CORE) |
1024 |
| ABKW |
OVERALL HEIGHT |
0.220 INCHES MINIMUM AND 0.360 INCHES MAXIMUM |
| CWSG |
TERMINAL SURFACE TREATMENT |
SOLDER |