5962-01-324-2476 ( MV8804DG , 1138003G1 , MT2204AC , 1138003G1 )

NSN Information
NSN FSC NIIN Item Name INC
5962-01-324-2476 5962 013242476 MICROCIRCUIT,DIGITAL 3177
NSN Features
MRC Parameter Characteristics
CQSZ INCLOSURE CONFIGURATION DUAL-IN-LINE
ADAT BODY WIDTH 0.593 INCHES MAXIMUM
CZEN VOLTAGE RATING AND TYPE PER CHARACTERISTIC 24.0 VOLTS MAXIMUM POWER SOURCE
CQZP INPUT CIRCUIT PATTERN 13 INPUT
ADAQ BODY LENGTH 1.281 INCHES MAXIMUM
TTQY TERMINAL TYPE AND QUANTITY 24 PRINTED CIRCUIT
AFJQ STORAGE TEMP RANGE -65.0/+150.0 DEG CELSIUS
AGAV END ITEM IDENTIFICATION 5805-01-188-3993 AN/TTC-42() (V)
CQSJ INCLOSURE MATERIAL CERAMIC
AFGA OPERATING TEMP RANGE -40.0/+85.0 DEG CELSIUS
CQWX OUTPUT LOGIC FORM COMPLEMENTARY-METAL OXIDE-SEMICONDUCTOR LOGIC
TEST TEST DATA DOCUMENT 96906-MIL-STD-883 STANDARD
ADAU BODY HEIGHT 0.202 INCHES MAXIMUM
AEHX MAXIMUM POWER DISSIPATION RATING 1200.0 MILLIWATTS
CWSG TERMINAL SURFACE TREATMENT SOLDER
CBBL FEATURES PROVIDED MONOLITHIC
Manufacturing Part Numbers (SKUs)
Part SKU Cage Status RNVC RNCC SADC DAC RNAAC
MV8804DG 53469 F 9 5 5 TX
1138003G1 28528 R 9 3 A TX
MT2204AC 36665 A 1 5 5 TX
1138003G1 31550 A 2 5 5 ZZ
Manufacturers
Part SKU Cage Manufacturer Type Status
MV8804DG 53469 MITEL SEMICONDUCTOR AMERICANS IN A F
1138003G1 28528 ITT INDUSTRIES INC A R
MT2204AC 36665 MITEL CORP ADAPTIVE SYSTEMS DIV A A
1138003G1 31550 ITT CORPORATION A A
FLIS Identification
PMIC ADPE Code CRITL Code DEMIL Code DEMIL INTG NIIN Asgt ESD HMIC ENAC Schedule-B INC
A 0 X D 1 08/11/1 B N 8542900000 3177
FLIS Management
MOE REC Rep Code Mgmt Ctl USC Phrase Code Phrase Statement
DM Z 10B2--- M V DISCONTINUED W/O REPLACEMENT
DS N I
Demilitarization Codes & Management
DML PMI HMIC ADP CC ESDC
D A N 0 X B
Miscellaneous Management
MOE (S_A) SOS AAC QUP UI SLC CIIC RC MCC SVC
DS SMS J 1 EA 0 7 D
DM SMS V 1 EA 0 7 Z 10B2--- M
Management Control Army
MATCAT 1 MATCAT 2 MATCAT 3 MATCAT 4 5 ARC
Freight
NMFC NMFC SUB UFC HMC LTL LCL WCC TCC SHC ADC ACC ASH NMF DESC
060500 X 81820 Z 72D Z 9 A H Z ELECTRICAL EQUIPMENT GROUP