| CQSZ |
INCLOSURE CONFIGURATION |
DUAL-IN-LINE |
| CBBL |
FEATURES PROVIDED |
BURN IN AND HERMETICALLY SEALED AND ELECTROSTATIC SENSITIVE AND POSITIVE OUTPUTS |
| AFGA |
OPERATING TEMP RANGE |
-55.0/+125.0 DEG CELSIUS |
| CQZP |
INPUT CIRCUIT PATTERN |
11 INPUT |
| CZEN |
VOLTAGE RATING AND TYPE PER CHARACTERISTIC |
-0.5 VOLTS MINIMUM POWER SOURCE AND 10.0 VOLTS MAXIMUM POWER SOURCE |
| CZEP |
CAPITANCE RATING PER CHARACTERISTIC |
10.00 INPUT PICOFARADS MAXIMUM |
| TTQY |
TERMINAL TYPE AND QUANTITY |
28 PRINTED CIRCUIT |
| ADAT |
BODY WIDTH |
0.500 INCHES MINIMUM AND 0.610 INCHES MAXIMUM |
| CTQX |
CURRENT RATING PER CHARACTERISTIC |
30.00 MILLIAMPERES MAXIMUM SUPPLY |
| AEHX |
MAXIMUM POWER DISSIPATION RATING |
500.0 MILLIWATTS |
| AFJQ |
STORAGE TEMP RANGE |
-65.0/+150.0 DEG CELSIUS |
| CTFT |
CASE OUTLINE SOURCE AND DESIGNATOR |
D-10 MIL-M-38510 |
| CXCY |
PART NAME ASSIGNED BY CONTROLLING AGENCY |
PLL,FREQ. SYNTHESIZER |
| ADAU |
BODY HEIGHT |
0.172 INCHES MINIMUM AND 0.217 INCHES MAXIMUM |
| CQSJ |
INCLOSURE MATERIAL |
CERAMIC |
| ADAQ |
BODY LENGTH |
1.490 INCHES MAXIMUM |
| CQWX |
OUTPUT LOGIC FORM |
COMPLEMENTARY-METAL OXIDE-SEMICONDUCTOR LOGIC |
| TEST |
TEST DATA DOCUMENT |
96906-MIL-STD-883 STANDARD (INCLUDES INDUSTRY OR ASSOCIATION STANDARDS, INDIVIDUAL MANUFACTUREER STANDARDS, ETC.). |
| CSSL |
DESIGN FUNCTION AND QUANTITY |
1 PHASE LOCKED LOOP |
| ABMK |
OVERALL WIDTH |
0.610 INCHES MAXIMUM |
| CZEQ |
TIME RATING PER CHACTERISTIC |
175.00 NANOSECONDS MAXIMUM PROPAGATION DELAY |
| ABHP |
OVERALL LENGTH |
1.490 INCHES MAXIMUM |
| ABKW |
OVERALL HEIGHT |
0.432 INCHES MAXIMUM |
| CWSG |
TERMINAL SURFACE TREATMENT |
SOLDER |