| ADAT |
BODY WIDTH |
0.515 INCHES MINIMUM AND 0.600 INCHES MAXIMUM |
| CQSZ |
INCLOSURE CONFIGURATION |
DUAL-IN-LINE |
| AFGA |
OPERATING TEMP RANGE |
-55.0/+125.0 DEG CELSIUS |
| CZER |
MEMORY DEVICE TYPE |
EPROM |
| CBBL |
FEATURES PROVIDED |
ULTRAVIOLET ERASABLE AND HERMETICALLY SEALED AND BURN IN AND PROGRAMMABLE |
| CZEP |
CAPITANCE RATING PER CHARACTERISTIC |
6.00 INPUT PASCAL DENSE STRUCTURAL 65 AND 12.00 OUTPUT PASCAL DENSE STRUCTURAL 65 |
| ABKW |
OVERALL HEIGHT |
0.357 INCHES NOMINAL |
| CQZP |
INPUT CIRCUIT PATTERN |
13 INPUT |
| ADAQ |
BODY LENGTH |
1.285 INCHES MAXIMUM |
| ADAU |
BODY HEIGHT |
0.217 INCHES MAXIMUM |
| TTQY |
TERMINAL TYPE AND QUANTITY |
24 PRINTED CIRCUIT |
| AFJQ |
STORAGE TEMP RANGE |
-65.0/+150.0 DEG CELSIUS |
| AEHX |
MAXIMUM POWER DISSIPATION RATING |
633.0 MILLIWATTS |
| CQSJ |
INCLOSURE MATERIAL |
CERAMIC |
| PKWT |
UNPACKAGED UNIT WEIGHT |
6.5 GRAMS |
| CZEQ |
TIME RATING PER CHACTERISTIC |
450.00 NANOSECONDS MAXIMUM ACCESS |
| CRHL |
BIT QUANTITY (NON-CORE) |
16384 |
| TEST |
TEST DATA DOCUMENT |
96906-MIL-STD-883 STANDARD |
| CSWJ |
WORD QUANTITY (NON-CORE) |
2048 |
| CQWX |
OUTPUT LOGIC FORM |
N-TYPE METAL OXIDE-SEMICONDUCTOR LOGIC |
| CZEN |
VOLTAGE RATING AND TYPE PER CHARACTERISTIC |
-300.0 MILLIVOLTS MINIMUM INPUT AND 6.0 VOLTS MAXIMUM INPUT |
| CTQX |
CURRENT RATING PER CHARACTERISTIC |
115.00 MILLIAMPERES REVERSE CURRENT, DC ABSOLUTE |
| CWSG |
TERMINAL SURFACE TREATMENT |
SOLDER |