| CQSZ |
INCLOSURE CONFIGURATION |
DUAL-IN-LINE |
| AFGA |
OPERATING TEMP RANGE |
-55.0/+125.0 DEG CELSIUS |
| TEST |
TEST DATA DOCUMENT |
81349-MIL-M-38510 SPECIFICATION |
| ADAU |
BODY HEIGHT |
0.130 INCHES MINIMUM AND 0.185 INCHES MAXIMUM |
| CTFT |
CASE OUTLINE SOURCE AND DESIGNATOR |
D-8 MIL-M-38510 |
| TTQY |
TERMINAL TYPE AND QUANTITY |
20 PRINTED CIRCUIT |
| CSSL |
DESIGN FUNCTION AND QUANTITY |
8 TRANSCEIVER |
| CZEQ |
TIME RATING PER CHACTERISTIC |
11.50 NANOSECONDS MAXIMUM PROPAGATION DELAY TIME, HIGH TO LOW LEVEL OUTPUT AND 11.50 NANOSECONDS MAXIMUM PROPAGATION DELAY TIME, LOW TO HIGH LEVEL OUTPUT |
| ZZZK |
SPECIFICATION/STANDARD DATA |
81349-MIL-M-38510/755 GOVERNMENT SPECIFICATION |
| AFJQ |
STORAGE TEMP RANGE |
-65.0/+150.0 DEG CELSIUS |
| CZEN |
VOLTAGE RATING AND TYPE PER CHARACTERISTIC |
-0.5 VOLTS MINIMUM POWER SOURCE AND 7.0 VOLTS MAXIMUM POWER SOURCE |
| AEHX |
MAXIMUM POWER DISSIPATION RATING |
300.0 MILLIWATTS |
| CQSJ |
INCLOSURE MATERIAL |
CERAMIC |
| CTQX |
CURRENT RATING PER CHARACTERISTIC |
100.00 MILLIAMPERES AVERAGE FORWARD CURRENT AVERAGED OVER A FULL 60-HZ CYCLE NOT APPLICABLE |
| ADAQ |
BODY LENGTH |
1.060 INCHES MAXIMUM |
| CQWX |
OUTPUT LOGIC FORM |
COMPLEMENTARY-METAL OXIDE-SEMICONDUCTOR LOGIC |
| CZEP |
CAPITANCE RATING PER CHARACTERISTIC |
15.00 INPUT PASCAL DENSE STRUCTURAL 65 AND 15.00 OUTPUT PASCAL DENSE STRUCTURAL 65 |
| ADAT |
BODY WIDTH |
0.220 INCHES MINIMUM AND 0.310 INCHES MAXIMUM |
| CBBL |
FEATURES PROVIDED |
MONOLITHIC AND 3-STATE OUTPUT AND W/ENABLE |
| ABKW |
OVERALL HEIGHT |
0.400 INCHES MAXIMUM |
| CXCY |
PART NAME ASSIGNED BY CONTROLLING AGENCY |
OCTAL BIDIRECTIONAL TRANSCEIVER |
| CQZP |
INPUT CIRCUIT PATTERN |
10 INPUT |
| ABHP |
OVERALL LENGTH |
1.060 INCHES MAXIMUM |
| CWSG |
TERMINAL SURFACE TREATMENT |
SOLDER |